Atomic force microscopy (AFM) belongs to the scanning probe microscopy (SPM) family, where a tip with a radius of usually a few nanometers scans the surface of a sample. The detection of a surface is not achieved via optical or electron-based methods, but via the interaction forces between the tip and the sample surface. Thus, this technique is not limited to topographic characterization of a sample surface (3D resolution which can go down to a few nanometers), but also allows the measurement of any type of interaction forces such as electrostatic, van der Waals or contact forces. Furthermore, the tip can be used to apply forces at the surface of a biological sample a....