Due to their superior mechanical, electrical, and optical properties in comparison to their layered bulk analogs, 2D materials have attracted considerable attention among the scientific community. Being the predecessor and the most studied of all 2D materials for several decades, graphene is still in the spotlight of cutting-edge discoveries such as membranes1, sensors2, catalysts3, energy technologies4, topological spintronic devices5, and condensed matter physics6. Inspired by that, numerous other 2D materials have been synthesized and investigated, such as metal chalcogenides7, layered double hydroxides8, and boron nitride9. Including the newest additions to the family of 2D materials (i.e., phosphorene10), MXenes (2D metal carbides or nitrides)11, and 2D polymers (single/few-layer 2D metal/covalent organic frameworks)12,13, the family of 2D materials has grown to consist of more than 150 members featuring intrinsic insulators, semiconductors, semimetals, and metals14.
The emerging 2D materials, such as BP15,16,17,18,19,20,21,22, molybdenum disulfide (MoS2)23,24,25,26, and indium(III) selenide (In2Se3)27,28,29, have shown considerable potential in scientific discoveries; however, to extend their excellent physiochemical properties to a macroscopic scale, efficient, reproducible, and low-cost methods are urgently needed. Electrochemical exfoliation is a promising approach for the upscale production of such 2D materials30,31, mainly due to the fact that it can provide gram scales of high-quality and dispersible exfoliated materials in minutes to a few hours due to the efficient intercalation of ions under the electric force.
The accompanying video demonstrates the step-by-step production of dispersions of BP, one of the most promising emerging 2D materials with applications in (opto)electronics, using electrochemical exfoliation, followed by sonication and centrifugation for the separation of flakes from unexfoliated particles, the preparation of dispersions of exfoliated BP flakes in various solvents, and morphological characterization by SEM, AFM, and TEM.