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Implementation of a Reference Interferometer for Nanodetection
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JoVE Journal Engineering
Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

DOI:
10.3791/51133-v

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16:11 min

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April 26, 2014

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, ,
1Department of Electrical and Computer Engineering,University of Victoria

Chapters

  • 00:00Title
  • 01:36Reference Interferometer Construction
  • 03:01Free Spectral Range Measurement
  • 03:57Fiber Pulling
  • 06:46Preparation and Delivery of Solutions
  • 12:43System Configuration and Interconnections
  • 14:06Nanoparticle Detection
  • 14:45Post-processing of Data
  • 15:32Conclusion

Summary

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A reference interferometer technique, which is designed to remove undesirable laser jitter noise for nanodetection, is utilized for probing an ultra-high quality factor microcavity. Instructions for assembly, setup, and data acquisition are provided, alongside the measurement process for specifying the cavity quality factor.

Tags

Keywords: Reference InterferometerNanodetectionFiber InterferometerMicrocavityFree Spectral RangeFiber TaperLaser Jitter NoisePolystyrene NanobeadsAdaptive Curve FittingQuality FactorResonant WavelengthSplit Frequency ShiftsBinding Events

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