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रैपिड III-V Heteroepitaxial विशेषता के लिए इलेक्ट्रॉन Channeling कंट्रास्ट इमेजिंग

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Journal (Engineering)

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Excitation-Scanning Hyperspectral Imaging Microscopy to Efficiently Discriminate Fluorescence Signals

Journal (Engineering)

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रैपिड III-V Heteroepitaxial विशेषता के लिए इलेक्ट्रॉन Channeling कंट्रास्ट इमेजिंग

Article DOI: 10.3791/52745-v • 07:50 min • July 17th, 2015

July 17th, 2015 •

Julia I. Deitz¹, Santino D. Carnevale², Steven A. Ringel³, David W. McComb³, Tyler J. Grassman^1,2

¹Department of Materials Science and Engineering, The Ohio State University, ²Department of Electrical and Computer Engineering, The Ohio State University, ³Institute of Materials Research, The Ohio State University

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इंजीनियरिंग अंक 101 इलेक्ट्रॉन channeling विपरीत इमेजिंग ECCI इलेक्ट्रॉन माइक्रोस्कोपी जाली बेमेल मिसफिट dislocations अर्धचालक heterostructures तीव्र लक्षण वर्णन

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