Overview
This article details a protocol for preparing and mounting protein microcrystals (<10 μm) on cryoTEM grids for single crystal cryo-crystallography at the VMXm beamline, Diamond Light Source. The method focuses on minimizing background noise during X-ray diffraction by optimizing sample environment and preparation, leveraging techniques adapted from cryoTEM, and ensuring high-quality sample vitrification and assessment.
Key Study Components
Area of Science
- Structural biology
- Macromolecular crystallography
- Sample preparation for X-ray diffraction
Background
- Microcrystals produce weaker diffraction signals, making high signal-to-noise ratios critical for quality data.
- Major sources of background noise include air path, excess crystallization solution, crystalline ice, and scatter from instrumentation.
- Advances in beamline optics and sample environments have improved data quality, but further gains depend on optimized sample preparation.
- Protocols adapted from cryoTEM, such as using holey carbon grids and plunge freezing, help reduce noise and improve sample quality.
Purpose of Study
- To present a robust protocol for preparing and mounting protein microcrystals for X-ray diffraction at VMXm.
- To demonstrate methods for reducing background noise and improving signal-to-noise ratio in microcrystal diffraction experiments.
- To provide strategies for assessing and optimizing sample quality prior to data collection.
Methods Used
- Glow discharge treatment of cryoTEM grids to enhance sample adherence.
- Automated plunge freezing using robotics and liquid ethane for rapid vitrification.
- Precise blotting to minimize surrounding liquid and prevent crystalline ice formation.
- Assessment of crystal density and distribution using visible light and scanning electron microscopy (SEM).
- Mounting of vitrified grids onto VMXm sample holders under cryogenic conditions.
Main Results
- Prepared grids showed minimal background scatter and excess liquid, with a narrow halo of vitrified liquid around crystals.
- Individual and clumped crystals were observed; optimization was needed for blotting time and crystal concentration.
- Overloaded grids reduced blotting efficiency and led to multiple lattices in diffraction images.
- Short blotting times for viscous solutions resulted in overly wet samples; for low viscosity, uneven crystal distribution occurred.
- Optimized preparation enabled high-resolution X-ray diffraction data collection with high signal-to-noise ratios.
Conclusions
- Careful optimization of blotting parameters and sample concentration is essential for high-quality microcrystal diffraction data.
- The described protocol allows efficient use of limited samples and supports advanced structural studies at the VMXm beamline.
- Prepared samples are suitable for X-ray diffraction, microcrystal electron diffraction, or focused ion beam milling.
What is the main challenge in mounting microcrystals for cryo-crystallography?
The main challenge is achieving a high signal-to-noise ratio due to weak diffraction from microcrystals and significant background noise from air, excess liquid, and ice formation.
How does the protocol minimize background noise during X-ray diffraction?
The protocol uses an in-vacuum environment, precise blotting to remove excess liquid, rapid vitrification with plunge freezing, and cryoTEM grids to reduce sources of scatter and ice formation.
Why is glow discharge treatment of grids important?
Glow discharge increases the hydrophilicity of the grid surface, improving sample spreading and adherence, which is crucial for even crystal distribution and minimal background.
How is sample quality assessed before X-ray diffraction?
Sample quality is assessed using visible light microscopy and scanning electron microscopy to check crystal density, distribution, and the presence of excess liquid or ice.
What are common issues encountered during sample preparation?
Common issues include overloaded grids, inefficient blotting, uneven crystal distribution, and the presence of crystalline or surface ice, all of which can degrade diffraction data quality.
Can this protocol be used with limited sample quantities?
Yes, the protocol is designed to use minimal sample volumes, and density assessment can be skipped if the sample is very limited.
What applications are possible with the prepared microcrystal samples?
Prepared samples can be used for X-ray diffraction at VMXm, microcrystal electron diffraction, or focused ion beam milling prior to microED.