Peakforce Qnm

PeakForce QNM is an atomic force microscopy mode that maps surface topography alongside local nanomechanical properties, including adhesion, deformation, and stiffness. It repeatedly brings a probe into brief contact with a sample, controls the maximum interaction force during each tap, and analyzes the resulting force-distance curves to generate quantitative property maps. In engineering, PeakForce QNM helps characterize polymers, composites, coatings, thin films, and other heterogeneous materials at nanoscale resolution. By correlating mechanical behavior with surface structure, the technique supports failure analysis, material development, quality control, and optimization of interfaces and advanced manufacturing processes.

Peakforce Qnm - Related Videos

Research

JoVE Journal - Engineering

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Cited by 6 •

2014

A method for investigating the structure of a protein photoreceptor using atomic force microscopy (AFM) is described in this paper. PeakForce Quantitative Nanomechanical Property Mapping (PF-QNM) reveals intact protein dimers on a mica surface.

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