Ellen Hieckmann

Ellen Hieckmann

Institute of Applied Physics, Technische Universität Dresden

Affiliated withTechnische Universität Dresden

Research Area

Engineering

Biography

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JoVE Journal Publications

ArticleTotal : 1
Year
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Publication title

Cited by 4

2016

Other Publications

Article
Year

No publications found