Hydrogen Depth Profiling
Hydrogen Depth Profiling - Related Videos
14:11
Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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Cited by 21 •
2016
We illustrate the application of 1H(15N,αγ)12C resonant nuclear reaction analysis (NRA) to quantitatively evaluate the density of hydrogen atoms on the surface, in the volume, and at an interfacial layer of solid materials. The near-surface hydrogen depth profiling of a Pd(110) single crystal and of SiO2/Si(100) stacks is described.
06:06
Hydrogenation
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2023
Source: Vy M. Dong and Zhiwei Chen, Department of Chemistry, University of California, Irvine, CA This experiment will demonstrate the hydrogenation of chalcone as an example of an alkene hydrogenation reaction (Figure 1). In this experiment, palladium on carbon (Pd/C) will be used as a heterogeneous catalyst for the process. A balloon will be used to supply the hydrogen atmosphere. Figure 1: Diagram showing the hydrogenation of chalcone to 3-phenylpropiophenone.
07:10
3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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2020
The presented method describes how to identify and solve measurement artifacts related to secondary ion mass spectrometry as well as obtain realistic 3D distributions of impurities/dopants in solid state materials.
08:56
Catalytic Reactor: Hydrogenation of Ethylene
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2023
Source: Kerry M. Dooley and Michael G. Benton, Department of Chemical Engineering, Louisiana State University, Baton Rouge, LA The hydrogenation of ethylene (C2H4) to ethane (C2H6) has often been studied as a model reduction reaction in characterizing new metal catalysts.1-2 While supported nickel is not the most active metal catalyst for this reaction, it is active enough that reaction can take place at < 200°C. The reaction typically involves adsorbed, dissociated hydrogen (H2) reacting...
01:04
Hydrogen Bonds
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2025
A hydrogen bond is formed when a weakly positive hydrogen atom already bonded to one electronegative atom (for example, the oxygen in the water molecule) is attracted to another electronegative atom from another polar molecule, such as water (H2O), hydrogen fluoride (HF), or ammonia (NH3). The huge electronegativity difference between the H atom (2.1) and the atom to which it is bonded (4.0 for an F atom, 3.5 for an O atom, or 3.0 for an N atom), combined with the very small size of an H atom...
FAQs
Depth resolution comes from how the measurement assigns signal to a location. In layer-by-layer analysis, removing successive material exposes deeper regions, so hydrogen readings can be ordered by removed depth. In particle-based approaches, the energy and identity of emitted particles carry depth-related information. This distinction determines how engineers interpret the resulting concentration profile.
A measured profile shows how hydrogen content varies through the material rather than only reporting an overall amount. Comparing the distribution across depth helps evaluate hydrogen uptake and diffusion, while localized or retained hydrogen can provide evidence relevant to trapping. Engineers use these observations to assess conditions associated with hydrogen embrittlement and material performance.
The methods obtain depth information through different measurement principles. Secondary ion mass spectrometry removes material layer by layer, whereas nuclear reaction analysis and elastic recoil detection interpret the energy and identity of particles associated with material at different depths. Because their signals arise differently, the methods offer distinct analytical routes for examining hydrogen distributions in solids.
During failure analysis, the measured hydrogen distribution can be related to hydrogen uptake, diffusion, trapping, and embrittlement in metals, alloys, coatings, or semiconductor devices. Examining where hydrogen is concentrated helps characterize material behavior associated with performance loss. The resulting evidence supports investigation of why a component or engineered material did not meet its expected durability.
Hydrogen concentration as a function of depth provides feedback on how hydrogen enters or moves through an engineered structure. Engineers can use that information when optimizing processing conditions or designing barrier layers intended to control hydrogen penetration. The profiles therefore connect material-processing decisions with hydrogen behavior and help support development of more durable systems.
Hydrogen Depth Profiling is relevant to metals, alloys, coatings, and semiconductor devices, so its use extends across several engineering material classes. The resulting measurements support failure analysis, process optimization, and barrier-layer development. They also contribute to the development of more durable materials for energy-related and industrial applications where hydrogen behavior affects performance.