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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
JoVE Journal
Chemistry
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JoVE Journal Chemistry
3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
DOI:

07:10 min

April 29, 2020

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Chapters

  • 00:00Introduction
  • 00:57Defect Selective Etching
  • 02:09Scanning Electron Microscopy
  • 02:50Secondary Ion Mass Spectrometry
  • 05:34Results: Oxygen Counts in a Cuboid
  • 06:29Conclusion

Summary

Automatic Translation

The presented method describes how to identify and solve measurement artifacts related to secondary ion mass spectrometry as well as obtain realistic 3D distributions of impurities/dopants in solid state materials.

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