Spectral Interferometry
Spectral Interferometry - Related Videos
05:13
Biolayer Interferometry Technology to Detect Interactions between Ligand and Analyte
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2025
In this video, we demonstrate biolayer interferometry (BLI) technology to detect the intermolecular interactions between ligands and target analytes in real-time. BLI measures changes in the interference pattern of white light reflected off a layer of immobilized ligands on a biosensor surface as they interact with analytes in solution.
12:14
The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
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Cited by 7 •
2013
Large laser-interferometers are being constructed to create a new type of astronomy based on gravitational waves. Their sensitivities, as for many other high-precision experiments, are approaching fundamental noise limits such as the atomic vibration of their components. We are pioneering technologies to overcome these limits using novel laser beam shapes.
11:21
Integrated Photoacoustic Ophthalmoscopy and Spectral-domain Optical Coherence Tomography
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Cited by 24 •
2013
Photoacoustic ophthalmology (PAOM), an optical-absorption-based imaging modality, provides the complementary evaluation of the retina to the currently available ophthalmic imaging technologies. We report the using of PAOM integrated with spectral-domain optical coherence tomography (SD-OCT) for simultaneous multimodal retinal imaging in rats.
11:47
Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Cited by 13 •
2013
White light microscope interferometry is an optical, noncontact and quick method for measuring the topography of surfaces. It is shown how the method can be applied toward mechanical wear analysis, where wear scars on tribological test samples are analyzed; and in materials science to determine ion beam sputtering or laser ablation volumes and depths.
10:28
High-plex Imaging using Spectral Confocal Microscopy to Minimize Non-specific Tissue Fluorescence
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2025
Spectral Iterative Bleaching Extends Multiplexity (IBEX) builds upon the base IBEX technique by adding heparin blocking to minimize nonspecific binding and leveraging spectral detection with computational unmixing to suppress autofluorescence. This approach accelerates image acquisition while reducing sources of background, enabling robust multi-round, high-parameter spatial proteomic analyses.
FAQs
Spectral fringe frequency indicates how rapidly the interference pattern changes across wavelength, while fringe phase records the pattern’s positional offset. Together, these signatures encode the optical path difference between reference and sample paths. Analyzing both therefore supports measurements of distance, thickness, and material properties rather than relying on fringe visibility alone.
The reference path provides a comparison optical signal, while the sample path carries information from the measured component or material. Their combination creates the wavelength-dependent pattern needed for analysis. Changes associated with the sample path alter the observed fringes, allowing the measurement to relate spectral behavior to component geometry or material characteristics.
Fourier-transform analysis converts the recorded spectral-fringe information into a representation that can distinguish contributions from separate reflection points. This separation helps identify interfaces at different depths instead of treating the entire signal as one combined response. In engineering inspection, that capability supports depth-resolved assessment of surfaces, layers, and component structures.
A typical measurement combines light traveling through a reference path with light returning from or passing through a sample path. The resulting interference spectrum is recorded as fringes that vary with wavelength. Fourier-transform processing then analyzes their frequency and phase content, separating depth-related reflections or interfaces for quantitative interpretation.
The measured spectral response can provide information about distance, thickness, surface profile, or material properties, depending on the engineering application. When multiple interfaces contribute, Fourier analysis helps distinguish their depths. These outcomes make the technique useful for characterizing thin films, inspecting components, and evaluating optical and electronic materials without requiring contact.
Engineers may choose Spectral Interferometry when they need noncontact, high-axial-resolution measurements for precision metrology or inspection. It can support thin-film characterization, surface profiling, and fiber-optic sensing, while also helping monitor manufacturing processes. The same capabilities extend to optical and electronic materials, where thickness, interfaces, or material properties are important.