Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Katherine J. Harry; Dilworth Y. Parkinson; Nitash P. Balsara

doi:10.3791/53021

JoVE Journal
Engineering

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JoVE Journal Engineering

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

电池的使用同步为基础的硬X射线微断层故障分析

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08:11 min

August 26, 2015

DOI: 10.3791/53021-v

Katherine J. Harry^1,2, Dilworth Y. Parkinson³, Nitash P. Balsara^2,4,5

¹Department of Materials Science and Engineering,University of California Berkeley, ²Materials Science Division,Lawrence Berkeley National Laboratory, ³Advanced Light Source Division,Lawrence Berkeley National Laboratory, ⁴Department of Chemical and Biomolecular Engineering,University of California Berkeley, ⁵Environmental Energy Technology Division,Lawrence Berkeley National Laboratory

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Summary

关键词：电池故障分析锂枝晶 X射线显微断层扫描可充电电池锂离子电池阳极形态电池寿命无损成像