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Picometer-Precision Atomic Position Tracking through Electron Microscopy

Article DOI: 10.3791/62164-v • 15:04 min • July 3rd, 2021
July 3rd, 2021 •
1, 1, 2, 1
1Department of Materials Science & Engineering, The Pennsylvania State University, 2Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

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Summary
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This work presents a workflow for atomic position tracking in atomic resolution transmission electron microscopy imaging. This workflow is performed using an open-source Matlab app (EASY-STEM).

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Picometer-precision Atomic Position Tracking Electron Microscopy Aberration Correction Sub-angstrom Resolution Individual Atoms Crystal Software Data Analysis Methods EasySTEM Metrology Stained Images Graphical User Interface Denoising Drift Correction Atom Column Positions Lattice Strain Distortion Defects Interfaces Overlapping Atom Columns Unit 7 Mixing Algorithms
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