Amplitude-modulation Afm
Amplitude-modulation Afm - Related Videos
10:25
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Cited by 39 •
2016
We present a method for achieving sub-nanometer resolution images with amplitude-modulation (tapping mode) atomic force microscopy in liquid. The method is demonstrated on commercial atomic force microscopes. We explain the rationale behind our choices of parameters and suggest strategies for resolution optimization.
08:21
Quantitative Hardness Measurement by Instrumented AFM-indentation
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Cited by 6 •
2016
This experimental protocol describes how atomic force microscopy can be used to measure hardness at the true nanometer scale and to detect single atomistic plasticity events.
09:47
AFM and Microrheology in the Zebrafish Embryo Yolk Cell
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Cited by 3 •
2017
The lack of tools to measure material properties and tensional parameters in vivo prevents validating their roles during development. We employed atomic force microscopy (AFM) and nanoparticle-tracking to quantify mechanical features on the intact zebrafish embryo yolk cell during epiboly. These methods are reliable and widely applicable avoiding intrusive interventions.
09:45
Amplitude-Modulated Electrodeformation to Evaluate Mechanical Fatigue of Biological Cells
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Cited by 4 •
2023
Presented here is a protocol for mechanical fatigue testing in the case of human red blood cells using an amplitude-modulated electrodeformation approach. This general approach can be used to measure the systematic changes in morphological and biomechanical characteristics of biological cells in a suspension from cyclic deformation.
09:54
A Small Volume Bioassay to Assess Bacterial/Phytoplankton Co-culture Using WATER-Pulse-Amplitude-Modulated (WATER-PAM) Fluorometry
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Cited by 13 •
2015
The goal of this procedure is to demonstrate the reproducibility and adaptability of using a microtiter plate format for microalgal screening. This rapid screen combines WATER-Pulse-Amplitude-Modulated (WATER-PAM) fluorometry to measure photosynthetic yield as an indicator of Photosystem II (PSII) health with small volume bacterial-algal co-cultures.
FAQs
Tip–sample interactions modify the cantilever’s oscillation amplitude and phase as the probe moves across a surface. These changes reflect variations in the local interaction experienced by the tip, allowing the instrument to distinguish height differences and material-dependent responses. Interpreting both signals can therefore extend surface characterization beyond topography alone, including properties such as adhesion and stiffness.
The cantilever operates close to its resonance frequency, where oscillatory behavior provides a sensitive response to tip–sample interactions. Small interaction-related changes can then appear as measurable variations in amplitude or phase. Maintaining this operating condition supports stable scanning and helps the system detect nanoscale differences in surface structure or material response.
A feedback system adjusts the cantilever’s vertical position while the tip scans the sample, maintaining a selected oscillation response. This adjustment compensates for changes encountered across the surface and converts the required vertical motion into information about topography. Appropriate feedback behavior is therefore central to tracking roughness and preserving a consistent measurement during the scan.
A typical measurement sets the cantilever vibrating near resonance, establishes a selected oscillation response, and brings the probe near the sample surface. The tip then scans across the area while the feedback system adjusts vertical position. During acquisition, amplitude and phase changes are monitored, providing data that can be used to examine topography and selected material properties.
Beyond mapping surface height, the technique can characterize roughness, adhesion, stiffness, and nanoscale defects. These outputs arise from changes in the cantilever response produced by local tip–sample interactions. Examining several response characteristics helps engineering researchers compare surface regions and relate nanoscale features to the behavior of polymers, coatings, semiconductors, or biological materials.
AM-AFM is useful when researchers need nanoscale information from polymers, semiconductors, coatings, or biological materials while seeking reduced surface contact and damage compared with contact-mode imaging. It can reveal roughness, defects, adhesion, and stiffness in the same general measurement context, making it relevant for examining engineered surfaces and material interfaces.