Beam Hardening Correction

Beam hardening correction is a computational and calibration-based technique used in X-ray computed tomography (CT) to reduce image artifacts caused by energy-dependent photon absorption. In a polychromatic X-ray beam, lower-energy photons are absorbed preferentially as the beam passes through an object, increasing its mean energy and producing effects such as cupping, streaks, and inaccurate attenuation values. Correction methods characterize this nonlinear relationship using reference measurements, material models, or reconstruction algorithms, then adjust projection data or images accordingly. In engineering, improved correction supports more reliable dimensional inspection, material analysis, defect detection, and quantitative assessment of dense or complex components.

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Education

JoVE Science Education - Engineering

Tests of Hardened Concrete in Tension

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2023

Source: Roberto Leon, Department of Civil and Environmental Engineering, Virginia Tech, Blacksburg, VA In a previous laboratory focused on concrete in compression, we observed that concrete can withstand very large stresses under uniaxial compressive forces. However, the failures observed were not compressive failures but failures along shear planes where maximum tensile forces occur. Thus, it is important to understand the behavior of concrete in tension and particularly its maximum strength...

Compression Tests on Hardened Concrete

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2023

Source: Roberto Leon, Department of Civil and Environmental Engineering, Virginia Tech, Blacksburg, VA There are two distinct stages in a construction project involving concrete. The first stage involves batching, transporting, and casting fresh concrete. At this stage, the material is viscous, and the workability and finishability are the key performance criteria. The second stage occurs when the hydration process begins shortly after the concrete is placed in the form, and the concrete will...

Research

JoVE Journal - Engineering
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Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

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Cited by 4 •

2018

We use an aberration-corrected scanning transmission electron microscope to define single-digit nanometer patterns in two widely-used electron-beam resists: poly (methyl methacrylate) and hydrogen silsesquioxane. Resist patterns can be replicated in target materials of choice with single-digit nanometer fidelity using liftoff, plasma etching, and resist infiltration by organometallics.

Focused Ion Beams

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2023

Source: Sina Shahbazmohamadi and Peiman Shahbeigi-Roodposhti-Roodposhti, School of Engineering, University of Connecticut, Storrs, CT As electron microscopes become more complex and widely used in research labs, it becomes more of a necessity to introduce their capabilities. Focused ion beam (FIB) is an instrument that can be employed in order to fabricate, trim, analyze and characterize materials on mico- and nano-scales in a wide variety of fields from nano-electronics to medicine. FIB...

Distance Corrections

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2025

To achieve precise distance measurements, especially in surveying and construction, certain corrections must be applied to account for potential sources of error like the standardization errors, temperature variations, and slope adjustments.Standardization error emerges when measurement equipment undergoes changes, such as wear, repairs, or weather impacts. To address this, surveyors compare the equipment’s readings to a standard. This process identifies any deviation that might lead to...

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