Synchrotron Microdiffraction
Synchrotron Microdiffraction - Related Videos
10:12
Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Cited by 8 •
2018
We describe a beamline setup meant to carry out rapid two-dimensional x-ray fluorescence and x-ray microdiffraction mapping of single crystal or powder samples using either Laue (polychromatic radiation) or powder (monochromatic radiation) diffraction. The resulting maps give information about strain, orientation, phase distribution, and plastic deformation.
08:51
Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
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Cited by 9 •
2008
We used synchrotron X-ray tomography at the European Synchrotron Radiation Facility (ESRF) to non-invasively produce 3D tomographic datasets with a pixel-resolution of 0.7µm. Using volume rendering software, this allows the reconstruction of internal structures in their natural state without the artefacts produced by histological sectioning.
07:26
Synthesis and Microdiffraction at Extreme Pressures and Temperatures
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Cited by 5 •
2013
The laser heated diamond anvil cell combined with synchrotron micro-diffraction techniques allows researchers to explore the nature and properties of new phases of matter at extreme pressure and temperature (PT) conditions. Heterogeneous samples can be characterized in situ under high pressure by 2D mapping and combined powder, single-crystal and multigrain diffraction approaches.
10:03
Characterization of Electrode Materials for Lithium Ion and Sodium Ion Batteries Using Synchrotron Radiation Techniques
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Cited by 9 •
2013
We describe the use of synchrotron X-ray absorption spectroscopy (XAS) and X-ray diffraction (XRD) techniques to probe details of intercalation/deintercalation processes in electrode materials for Li-ion and Na-ion batteries. Both in situ and ex situ experiments are used to understand structural behavior relevant to the operation of...
09:53
Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation
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Cited by 7 •
2012
A molecular beam coupled to tunable vacuum ultraviolet photoionization mass spectrometer at a synchrotron provides a convenient tool to explore the electronic structure of isolated gas phase molecules and clusters. Proton transfer mechanisms in DNA base dimers were elucidated with this technique.
FAQs
Diffraction patterns contain information from the arrangement of crystal planes and their direction within the sampled region. Changes in lattice spacing indicate local strain, while the distribution of diffracted features reveals crystallographic orientation. Comparing these signals across micrometer-scale locations allows engineers to separate deformation from orientation changes and identify spatially varying material responses.
The intense synchrotron beam provides sufficient diffracted signal from a very small sample volume, while its high collimation supports measurements from localized regions. Focusing the beam further restricts the analyzed material to a micrometer-scale area. Together, these characteristics make it possible to examine structural variations near interfaces, defects, and other limited regions.
Recorded patterns can indicate variations in lattice spacing, crystallographic orientation, phase, and local strain. These structural indicators help connect a material's microscopic state with processing history or mechanical response. In engineering studies, that connection is useful for examining how localized regions evolve near defects, interfaces, or areas subjected to applied loads.
A measurement begins by directing a focused, highly collimated synchrotron X-ray beam onto the selected material region. The sample is examined at micrometer-scale locations, and a detector records the resulting diffraction patterns. Researchers then interpret spatial variations in those patterns to map lattice structure, orientation, phase, and deformation across the region of interest.
This technique is particularly valuable when the engineering question concerns localized behavior rather than an average response from a larger material volume. It can examine regions associated with interfaces, defects, processing effects, or applied loads. The resulting spatially resolved information supports investigations where fatigue, fracture, residual stress, or phase transformations vary across a component.
By mapping local strain, lattice spacing, orientation, and phase, the method helps identify structural changes associated with fatigue and fracture. Measurements can show how deformation is distributed around relevant material regions instead of treating the component as uniform. Engineers can use this evidence for performance assessment, failure analysis, and evaluation of advanced structural materials.
Microfabricated devices contain small features where structural behavior may vary over limited distances. Synchrotron microdiffraction provides spatially resolved measurements suited to those regions, including information about local strain, orientation, phase, and lattice spacing. In engineering research, these data can support assessment of how processing, interfaces, defects, or applied loads affect device performance.