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Journal / Chemistry / Yerinde İletim Elektron Mikroskobu Kullanılarak…
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Yerinde İletim Elektron Mikroskobu Kullanılarak Tamamen Katı Hal Pili için Kaplamaların Taranması
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Yerinde İletim Elektron Mikroskobu Kullanılarak Tamamen Katı Hal Pili için Kaplamaların Taranması

Article DOI: 10.3791/64316-v • 07:20 min • January 20th, 2023
January 20th, 2023 •
1,2, 1, 2, 1, 2, 1, 1, 3, 2, 2,4, 1,5
1Institute of Energy and Climate Research - Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 2Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 3Dyson School of Design Engineering, Imperial College London, 4Central Facility for Electron Microscopy (GFE), RWTH Aachen University, 5Institute of Physical Chemistry, RWTH Aachen University

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(De)lithiation sırasında Si nanopartiküllerinin hacim değişimini kullanarak, mevcut protokol, in situ iletim elektron mikroskobu kullanarak tüm katı hal pilleri için potansiyel kaplamaların bir tarama yöntemini açıklamaktadır.

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