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Method Article

Characterization of Anisotropic Leaky Mode Modulators for Holovideo

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DOI:

10.3791/53889

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March 19th, 2016

In This Article

Summary

This work describes fabrication and characterization of anisotropic leaky mode modulators for holographic video.

Abstract

Holovideo displays are based on light-bending spatial light modulators. One such spatial light modulator is the anisotropic leaky mode modulator. This modulator is particularly well suited for holographic video experimentation as it is relatively simple and inexpensive to fabricate1-3. Some additional advantages of leaky mode devices include: large aggregate bandwidth, polarization separation of signal light from noise, large angular deflection and frequency control of color1. In order to realize these advantages, it is necessary to be able to adequately characterize these devices as their operation is strongly dependent on waveguide and transducer parameters4. To characterize the modulators, the authors use a commercial prism coupler as well as a custom characterization apparatus to identify guided modes, calculate waveguide thickness and finally to map the device's frequency input and angular output of leaky mode modulators. This work gives a detailed description of the measurement and characterization of leaky mode modulators suitable for full-color holographic video.

Introduction

Most holographic display technologies, such as pixelated light valves as well as MEMs devices and bulk wave acousto-optic modulators, are too complex to allow for broad participation in their development. Pixelated modulators, especially those with filter layers and active back planes may require dozens of patterning steps to build5 and may be limited by fan-out6. The greater the number of patterning steps the higher the device complexity, and the tighter the fabrication protocol must be to achieve reasonable device yield7. Bulk-wave acousto-optic modulators do not lend themselves to wafer based processes8,9. Anisotropic lea....

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Protocol

1. Initial Preparation

Note: Begin with a new X-cut lithium niobate wafer. It should be optical grade, 1 mm thick, clean, with nothing deposited on the surface, both sides polished, and the top side marked.

  1. Using an Electron Beam Evaporator or equivalent machine at a vacuum of 50 µTorr, evaporate 200 nm of aluminum on the wafer at 5 Å/sec. To replicate the presented results, position the wafer constellation 65 cm above the aluminum crucible.
  2. Spin on 30 drops of a positive photo resist, such as AZ3330, at 3,000 rpm for 60 sec. Softbake the resist at 90 °C for 60 sec. Note: For a detailed description of the mechanics of spinni....

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Results

The principle results of the protocol above are the guided mode measurement from the commercial prism coupler shown in Figure 2, the single frequency, raw input/output data gathered from the customized prism coupler shown in Figure 8 and the multicolor curves shown in Figure 9. In the following paragraphs we discuss the actionable information produced by each of these outputs.

T.......

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Discussion

The design of each device has two critical steps, proton exchange and development of the LOR. Of the two, proton exchange time determines the depth of the waveguide, which in turn determines the number of guided to leaky mode transitions, the controllable frequency bandwidth, and every key design parameter for each color of light. Two guided modes in red is desired. If more exist then bandwidth is sacrificed. If less exist then no guided to leaky mode transition is guaranteed. Follow the note in step 2.2.1 to correct pro.......

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Disclosures

The authors have nothing to disclose.

Acknowledgements

The authors gratefully acknowledge financial support from Air Force Research Laboratory contract FA8650-14-C-6571 and from DAQRI LLC.

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Materials

List of materials used in this article
NameCompanyCatalog NumberComments
X-Cut Lithium NiobateGooch and Housego99-00630-01Lithium Niobate 3″ Diameter X-CUT Wafer 1 mm Polish/Polish
Positive Photo Resist 1EMD Performance MaterialsAZ 3330 F PhotoresistUsed in the creation of the proton exchange mask
Photoresist DeveloperEMD Performance MaterialsAZ MIF 300Develops AZ3330 and LOR 3A
AluminiumInternational Advanced MaterialsAL1399.999% pure
Aluminium EtchTranseneType A Aluminum Etchant
Benzoic AcidSigma Aldrich109479-500G99% pure
AcetoneFisher ChemicalUN1009
IPAFisher ChemicalUN121999.5% pure isopropyl alcohol
Acidic Piranha etchCyantek CorperationNanostrip
Under Layer ResistMicro ChemLOR 3ABottom layer used for liftoff
Positive Photo ResistMicro Chem950 PMMA A9Top layer used for liftoff
AnisoleMicro ChemA Thinner
Conductive polymer aqueous solutionMitsubishi Rayon CompanyAquaSAVE
MIBK (4-methyl-2-pentanone)Sigma Aldrich360511Develops PMMA
NMP (1-methyl-2-pyrrolidone)Sigma Aldrich328634Used for liftoff
E-beam Evaporator Denton Vacuum Integrity 20Any equivalent equipment would suffice.
Thin Film SpinnerLaurell Technologies CorporationWS-400A-6NPP-LITEAny equivalent equipment would suffice.
Mask Aligner Karl Suss America Inc.MA 150 CCAny equivalent equipment would suffice.
Automatic Dicing Saw Disco CorperationDisco Dad 320Any equivalent equipment would suffice.
Muffle FurnaceThermo ScientificFB1415MAny equivalent equipment would suffice.
Electron MicroscopeFEIXL30 ESEMAny equivalent equipment would suffice.
Dehydration OvenLab-Line Instruments Ultra-Clean 100  (3497M-3)Any equivalent equipment would suffice.
Hot PlateThermo ScientificSP131325Any equivalent equipment would suffice.
PolisherUltra Tec Mfg., Inc.Ultrapol End & Edge PolisherAny equivalent equipment would suffice.
Class IIIb 12 V RBG Lasers: Wavelengths (nm): 638, 532, and 445Bought second-hand. Probably pulled from a laser projector. Any equivalent equipment would suffice.
Signal GeneratorAgilent8648DNow found at Keysight. Obsolete. Any equivalent equipment would suffice. Needed Frequency sweep 9 kHz-1,000 MHz.
Signal AmplifierMini-CircuitsTB-17Necessary only to overcome the limitations of the signal generator.
Power Meter ControllerThorLabsPM100DWith power meter model S130C. Any equivalent equipment would suffice. Needed sensitivity 500 pW.
Linear Actuator ControllerNewportESP7000With linear actuator model MFN25PP. Any equivalent equipment would suffice. Needs 0.1 mm accuracy.
AutomatedDeviceCharacterization.vi LabViewExperimental Control Software by BYUFound in the appendix
CompareWDMmodes.mMATLabAnalytical Software by BYUFound in the appendix

References

  1. Smalley, D., Smithwick, Q., Bove, V., Barabas, J., Jolly, S. Anisotropic leaky-mode modulator for holographic video displays. Nature. 498 (7454), 313-317 (2013).
  2. Smalley, D., Smithwick, Q., Bove, V. Holographic video display based on guided-wave acousto-optic devices. Proc. SPIE. ....

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Tags

Anisotropic Leaky Mode ModulatorSpatial Light ModulatorPrism CouplingFrequency Response MappingAngular Output MeasurementGuided Mode IdentificationWaveguide Thickness CalculationElectroholography CharacterizationRadio Frequency Signal GeneratorOptical Power Meter