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Method Article

In Situ Characterization of Boehmite Particles in Water Using Liquid SEM

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DOI:

10.3791/56058

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September 27th, 2017

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In This Article

Summary

We present a procedure for real-time imaging and elemental composition analysis of boehmite particles in deionized water by in situ liquid Scanning Electron Microscopy.

Abstract

In situ imaging and elemental analysis of boehmite (AlOOH) particles in water is realized using the System for Analysis at the Liquid Vacuum Interface (SALVI) and Scanning Electron Microscopy (SEM). This paper describes the method and key steps in integrating the vacuum compatible SAVLI to SEM and obtaining secondary electron (SE) images of particles in liquid in high vacuum. Energy dispersive x-ray spectroscopy (EDX) is used to obtain elemental analysis of particles in liquid and control samples including deionized (DI) water only and an empty channel as well. Synthesized boehmite (AlOOH) particles suspended in liquid are used as a model in the liquid SEM illustration. The results demonstrate that the particles can be imaged in the SE mode with good resolution (i.e., 400 nm). The AlOOH EDX spectrum shows significant signal from the aluminum (Al) when compared with the DI water and the empty channel control. In situ liquid SEM is a powerful technique to study particles in liquid with many exciting applications. This procedure aims to provide technical know-how in order to conduct liquid SEM imaging and EDX analysis using SALVI and to reduce potential pitfalls when using this approach.

Introduction

Scanning Electron Microscope (SEM) has been widely applied to investigate a variety of specimens by producing high resolution imaging1. The energy dispersive x-ray spectroscopy (EDX) associated with the SEM enables the determination of elemental composition1. Traditionally, SEM is applied for imaging only dry and solid samples. In the last 30 years, Environmental SEM (ESEM) was developed for analyzing the partial hydrated samples in a vapor environment2,3,4,5. However, ESEM is unable to image t....

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Protocol

1. Prepare AlOOH Liquid Sample

NOTE: Do not touch the specimen or anything inside the SEM chamber with bare hands. Powder free gloves should be worn at all times when handling the SALVI device and mounting it onto the SEM stage in order to avoid potential contamination during surface analysis.

  1. Make an AlOOH stock solution (1 mg/mL)
    1. Dissolve 10 mg of AlOOH powder in 10 mL DI water to make the 1 mg/mL AlOOH stock solution.
    2. Ultrasonicate the stock solution for 5 min.
      NOTE: The pH of the stock solution is approximately 4.6 measured by a pH meter. The solution of pH is not adjusted and ....

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Results

The representative results are presented to show how the particles are imaged and analyzed using in situ liquid SEM imaging coupled with EDX. The results include SE images and EDX spectra. The SE images were obtained at 100,000X and 200,000X magnification levels in Figure 1. Figure 1a depicts the SE image of the AlOOH, Figure 1b DI water, and Figure 1c the hole .......

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Discussion

SEM is a powerful technique in surface characterization of organic and inorganic materials on a nanoscale (nm) level with high resolution1. For example, it is widely used for analyzing the solid and dry samples such as geological materials26 and semiconductor27. However, it has limitations in characterizing the wet and liquid samples due to the incompatibility of liquid within the highly vacuumed environment required for electron microscopy

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Disclosures

The authors have nothing to disclose.

Acknowledgements

We are grateful to the Pacific Northwest National Laboratory (PNNL) Nuclear Process Science Initiative (NPSI)-Laboratory Directed Research and Development (LDRD) fund for support. Dr. Sayandev Chatterjee provided the synthesized boehmite particles. Instrumental access was provided through a W. R. Wiley Environmental Molecular Sciences Laboratory (EMSL) General User Proposal. EMSL is a national scientific user facility sponsored by the Office of Biological and Environmental Research (BER) at PNNL. PNNL is operated by Battelle for the DOE under Contract DE-AC05-76RL01830.

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Materials

List of materials used in this article
NameCompanyCatalog NumberComments
Carbon CoaterCressington208 CarbonIt is accompanied with thickness monitor MTM-10.
SEMFEIQuanta 3D FEGIt provides highly resolved scanning electron microscopy and elemental analysis.
System for Analysis at the Liquid Vacuum Interface (SALVI)Pacific Northwest National LaboratoryN/ASALVI is a unique, vacuum compatible microfluidic cell that enables the characterization of the liquid sample using vacuu- based scientific instrument.
PEEK UnionValcoZU1TPKThe polyether ether ketone union is used for connecting the inlet and outlet of SALVI
SyringeBD3096591 mL
PipetteThermo Fisher Scientific21-377-821Range: 100 to 1,000 mL
Pipette Tip 1Neptune2112.96.BS1,000 µL
Pipette Tip 2Rainin1700186520 µL
Syringe PumpHarvard Apparatus70-2213It is used to inject the liquid sample into the SALVI device.
pH meterFisher Scientific/accumet13-636-AP72It is used for measuring the pH of AlOOH in DI water.
Barnstead Ultrapure Water System, UV/UFThermo Scientific BarnsteadNanopure diamond D11931It is used for producing DI water.
Centrifuge tubesFisher scientific/Falcon15-527-9015 mL
Bransonic ultrasonic cleanerSigma-Aldrich2510It is used to ultrasonicate the AlOOH liquid sample.
BalanceMettler Toledo11106015XS64
AlOOHPacific Northwest National LaboratoryN/AIt is synthesized by scientists at Pacific Northwest National Laboratory.
xT microscope ControlFEIQuanta 3D FEGDefault microscope control software of SEM Quanta 3D FEG
EDAX Genesis softwareEDAXN/AThe software is used for collecting the EDX elemental information of the samples.
Teflon tubingSUPELCO58697-UIt is used for introducing the sample into the microchannel and holding adequate volume of liquid.

References

  1. Goldstein, J., et al. Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. , 2nd ed, (1992).
  2. Donald, A. M. The use of environmental scanning electron microscopy fo....

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