$$\rightleftharpoonup{xx}$$
$$\longleftharp{xx}$$,
$$\longrightharp{xx}$$,
The result of the process of fabrication described in sections 1 and 2 is illustrated by the images of Figure 1A-1B and the curve of Figure 1C. The table of Figure 1D displays the roughness values of two different representative areas of the PDMS chip, i.e. in the central and the 20 µm high next intermediate chamber. A decrease in roughness by a factor of about 7 has been obtained by using etched Si wafer instead of SU-8 photoresist. Then, FXm was first applied on a photoresist stripe of known geometry (Figure 2A) within a 10 µm high chamber. After image processing and intensity to height conversion (see the graph of Figure 2B), FXm profiles performed on cross-sections along this stripe (Figure 2C) provide the desired height profiles (Figure 2D). Figure 2D shows the comparison between profiles obtained using mechanical profilometry and FXm methods. These profiles, including edge and plateau value, are very similar, validating the method. Note that the scattering of FXm data is not representative of the ultimate resolution of the method, as further assessed in Figure 3 and Figure 4, but results from the low intensity employed to avoid a possible effect of the very weak auto-fluorescence of the photoresist in the GFP channel.
Then, we observed neurites in 3 µm and 10 µm high chambers (Figure 3). The standard deviation of the background noise is about 18 nm after intensity to height conversion and background correction. This value is slightly higher than the physical roughness of PDMS surfaces casted on silicon surfaces (12 nm, see the table of Figure 1D) but much lower than the roughness measured on PDMS obtained from SU-8 molds. These results highlight the added value of drilling wells into silicon wafers rather than opening holes into SU-8 photoresist to cast pillars. Such a low value allows a high signal to noise ratio and very clear images in volume such as the one displayed in Figure 3A. As an example of the data that can be retrieved from such images, we computed the volume of 1.6 µm (i.e. 10 pixels) wide neurite slice (see the graph of Figure 3B). Using in a first approximation a linear fit of these data gives a mean neurite height value of about 400 nm, to be compared with e.g. the 500-nm axonal diameter found in 10 days old pups within the corpus callosum 5. We also combined FXm with micropatterns of adhesion consisting of serially abutted 2 µm and 6 µm wide stripes of 30 µm in length. Our aim was to study the influence of the neurite width on its 3D shape. Figure 3C shows a 3D representation in false color of a whole neuron image obtained in a 10 µm high chamber. Neurites are spreading on 2 µm and 6 µm wide stripes, whereas the soma is located on the extremity of the largest stripe. Height profiles were drawn in three different cross sections. In coherence with the graph displayed in Figure 3A, the surface integrated over the cross-sections increase with the neurite width (Figure 3D).
We also focused on growth cone (GC) 3D structures. Figure 4A-B displays two different GC profiles obtained in a 3 µm high chamber, which highlight their branched sub-structure. In addition, we performed time-lapse experiments to follow the dynamics of the volume of GCs in a 12 µm high chamber. Figure 4C displays a cycle of shrinking and reactivation of a given GC within a time scale of a few tens of minutes. Thanks to the use of GFP-lifeact mice, growth cones were localized in the GFP emission wavelength (510 nm) from their high actin concentration. The surface identified at the wavelength was used to integrate over the dextran emission wavelength at 647 nm to compute GC volume. Figure 4D shows finally the distribution of GC volume at different time points and location on three different neurons, centered on a value of about 6 µm3.

Figure 1: FXm PDMS chambers. (A) Schemes of the four different main steps of microfabrication leading to the final mold. The location of the inlet, outlet and reservoirs are indicated. Scale bars: 1 mm. (B) Image of the PDMS FXm chamber obtained using an optical profilometer. This image shows the central chamber containing 3 rows of 10 µm high pillars and the intermediate chambers of 20, 50 and 90 µm in height. Scale bar: 500 µm. (C) Cross-sectional view of the chip along the two dashed lines drawn in (B). Yellow/gold: cross-section along pillars, blue: cross-section between pillars. (D) Mean values of the PDMS roughness measured on 50 × 50 µm2 areas molded on silicon and on the 20 µm high SU-8 intermediate chamber (see arrows for the location of these areas). Mean values were obtained from the measurements of three different areas. Please click here to view a larger version of this figure.

Figure 2: Calibration of FXm method using a photoresist stripe as the object of interest. (A) GFP-fluorescence image taken in a 10 µm high chamber filled with 10,000 MW dextran absorbing at 488 nm at 1 mg/mL. (B: background, P: pillar). Observation with a dry 40X NA 0.8 objective. Scale bar: 50 µm. (B) Linear calibration law obtained from the mean intensity of the two colored rectangles shown in A. (C) Fluorescence intensity profile obtained at the level of the blue dashed line displayed in (A), crossing the photoresist stripe (0.45 µm high positive photoresist). (D) Comparison of the profiles obtained from mechanical profilometer (black dots) and FXm after intensity to height conversion of the data of (B) (blue dots). Please click here to view a larger version of this figure.

Figure 3: Neurite volume imaging. (A) Neurite extending into the central 3 µm high chamber from soma located in the next 15 µm intermediate chamber. Imaging performed using 10,000 MW dextran absorbing at 488 nm and a 40X, NA 0.8 dry objective. The inset obtained after the use of the background reduction routine highlights the two neurites and chosen to plot the graph on the right. Scale bars: 30 µm. (B) Neurite slice volume as a function of neurite width obtained from the 22 profiles (average on 10 pixels, i.e. on a 1.6 µm "neurite slice") shown in (A). The solid line represents a linear fit of slope 0.4 µm passing through the origin. (C) False color image of a patterned neuron on an adhesive stripe made of successive 2 µm and 6 µm wide stumps (represented in white). Measurements were made in a 10 µm high chamber filled with 10,000 MW dextran absorbing at 647 nm and using a 40x NA 0.8 dry objective. (D) Height profiles corresponding to the colored dashed lines shown in (C), keeping the same color code. Please click here to view a larger version of this figure.

Figure 4: Static and dynamic growth cone imaging. (A-B) Growth cone height profiles obtained in a 3 µm high chamber after intensity to height conversion along the yellow lines displayed in associated images. Observation performed using a fill with 10,000 MW dextran absorbing at 488 nm and a 40X, NA 0.8 dry objective. (C) Whole neuron imaging in a 12 µm high chamber filled with 10,000 MW dextran absorbing at 647 nm. Observations have been made in two fluorescent channels: GFP for growth cone localization (dashed yellow lines), and CY5 to compute GC volume from fluorescence exclusion. The surface included by dashed yellow lines was used to compute GC volume. The graph shows the variation of GC volume over time, and associated morphologies in both GFP and CY5 channels at two representative different time points. All data were acquired using a 40x NA 0.8 dry objective every 3 min. Scale bars: 10 µm. Please click here to view a larger version of this figure.
| Step | Mask 1:8 µm layer | Mask 2:30 µm layer | Mask 3:40 µm layer |
| SU-8 type | 2007 | 2025 | 2050 |
| Spincoating | 30 s @ 2000 rpm | 30 s @ 3050 rpm | 30 s @ 3250 rpm |
| Soft bake | 3 min @ 95 °C | 2 min @ 65 °C + 6 min @ 95 °C | 3 min @ 65 °C + 7 min @ 95 °C |
| Exposure energy | 110 mJ/cm2 | 155 mJ/cm2 | 170 mJ/cm2 |
| Post-exposure bake | 4 min @ 95 °C | 1 min @ 65 °C + 6 min @ 95 °C | 2 min @ 65 °C + 7 min @ 95 °C |
| Development | 2 min 30 s | 5 min | 6 min |
| Hard bake (optional) | 3-5 min @ 200 °C | 3-5 min @ 200 °C | 3-5 min @ 200 °C |
Table 1: Photolithography steps performed to build a device containing a central chamber of 12 μm in height. Heights of the intermediate chambers: 20, 50 and 90 µm.
| Step | Mask 1:10 µm layer | Mask 2:30 µm layer | Mask 3:40 µm layer |
| SU-8 type | 2007 | 2025 | 2050 |
| Spincoating | 30 s @ 1500 rpm | 30 s @ 3050 rpm | 30 s @ 3250 rpm |
| Soft bake | 3 min @ 95 °C | 2 min @ 65 °C + 6 min @ 95 °C | 3 min @ 65 °C + 7 min @ 95 °C |
| Exposure energy | 125 mJ/cm2 | 155 mJ/cm2 | 170 mJ/cm2 |
| Post-exposure bake | 4 min @ 95 °C | 1 min @ 65 °C + 6 min @ 95 °C | 2 min @ 65 °C + 7 min @ 95 °C |
| Development | 2 min 30 s | 5 min | 6 min |
| Hard bake (optional) | 3-5 min @ 200 °C | 3-5 min @ 200 °C | 3-5 min @ 200 °C |
Table 2: Photolithography steps performed to build a device containing a central chamber of 10 μm in height. Heights of the intermediate chambers: 20, 50 and 90 µm.
| Step | Mask 1:12 µm layer | Mask 2:32 µm layer | Mask 3:40 µm layer |
| SU-8 type | 2015 | 2025 | 2050 |
| Spincoating | 30 s @ 3250 rpm | 30 s @ 2500 rpm | 30 s @ 3250 rpm |
| Soft bake | 3 min @ 95 °C | 2 min @ 65 °C + 5 min @ 95 °C | 3 min @ 65 °C + 7 min @ 95 °C |
| Exposure time | 140 mJ/cm2 | 157 mJ/cm2 | 170 mJ/cm2 |
| Post-exposure bake | 4 min @ 95 °C | 1 min @ 65 °C + 5 min @ 95 °C | 2 min @ 65 °C + 7 min @ 95 °C |
| Development | 3 min | 5 min | 6 min |
| Hard bake (optional) | 3-5 min @ 200 °C | 3-5 min @ 200 °C | 3-5 min @ 200 °C |
Table 3: Photolithography steps performed to build a device containing a central chamber of 3 μm in height. Heights of the intermediate chambers: 18, 50 and 90 µm.
Supplementary data 1: masks_neuron_volume_chips.tiff. Schematic view of the masks used to fabricate the PDMS device (DRIE mask and masks 1-3). Please click here to download this file.
Supplementary data 2: file "masks_neuron_volume_chips.dxf". Electronic files allowing to fabricate the DRIE mask and masks 1-3. Please click here to download this file.
Supplementary data 3: "Mask_Photoresist-stripes.dxf". Electronic files allowing to fabricate the mask used for the photolithography of photoresist stripes. Please click here to download this file.
Supplementary data 4: file conversion_mattotiff.m Please click here to download this file.
Supplementary data 5: file importfilevol.m Please click here to download this file.