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Process blanks and background contamination
An acceptable blank result is one that contains either no particles or so few particles that the background (i.e., process) contamination (if any) does not run a high likelihood of confusing or disrupting the results of the experiment. A suboptimal blank result is one that contains many particles that the particles of interest will be difficult to distinguish from the background contamination.
The acceptable level of process contamination should be at or as close to zero as possible, but if zero cannot be achieved, then consistency in the number of observed background particles is key. Run several blank samples to determine the consistency of results. Diligence in quality control protocols (refer to Section 1), contamination mitigation, and proper environmental conditions during processing are paramount to maintaining low background contamination levels. Background contamination results and acceptability may also depend heavily upon the cut-off of the nanomembranes being used, and the overall cleanliness of laboratory conditions. Take into account that when analyzing for smaller particles with lower cut-off membranes (e.g., < 8 µm), the relative abundance of the particles of interest and similarly sized background contaminants will both increase exponentially, necessitating higher levels of stringency in quality control be applied22. While any level of contamination is not acceptable, as long as conditions are tightly controlled and a high degree of consistency is achieved, good analyses of environmental microplastics or analytics of interest may still be performed.
Sample filtration
An ideal sample filtration is needed to generate a faithful multimodal analysis, as shown with the example data cascade in Figure 3. Such sample filtration will result in well-dispersed particles across the nanomembrane surface (e.g., with approximately one-third of membrane surface area coverage). Poorly dispersed particles, such as the case with particle aggregation (large clumps of overlapping particles), will confuse both manual and automated particle counting methods, as overlapping particles are not easily differentiated with confidence. Such data is usually excluded from analysis, which may lead to the loss of valuable information of interest. Well-dispersed particles, as shown in Figure 4A,B, ensure that any spectroscopic or quantification analyses are not complicated by stacked or overlapping particles of varying compositions, which could return results that are more difficult to accurately interpret, identify, and quantify.
Nile Red and Trypan Blue staining
Representative images of optimal fluorescent particle staining instances are shown in Figure 3B on a 20 µm cut-off SiN filter disk. Under-rinsing of the NR or TB stain from the nanomembrane surface may create false positive results. Residual particulates that are comprised of either stain retained on the membrane's surface due to insufficient rinsing may be falsely interpreted as stained particles. A sign that insufficient rinsing occurred is if areas of the nanomembrane without particles or detectable residual films/residues from the filtered sample are fluorescing during observation, as shown in Figure 5A. After imaging, as long as the filter disk was maintained in clean conditions, a re-rinse may be conducted by placing the individual nanomembrane filter disk back onto the vacuum filtration apparatus (minus the gaskets), turning on the vacuum, and filtering another volume of Ultrapure 99% IPA (for NR) or Ultrapure water (for TB) onto the filter disk's nanomembrane. Record the total volume of additional rinsing media used. For best results, take microscopy images of the entire nanomembrane surface before conducting a re-rinse to account for any contamination potentially incurred by the re-rinse step.
Raman spectroscopy
Raman spectroscopy performed on non-coated SiN may produce a prominent peak depending on the laser wavelength, and this peak may mask low abundance signals approximately within the 520 cm-1 wavenumber region23. If Raman spectra of interest are sufficiently separated from the Silicon or Silicon Nitride background peak, using non-coated SiN filter disks should yield adequate Raman spectroscopy results. In this report, Pipelines B and C both used Au-SiN filter disks. The Gold coating of Au-SiN masks the inherent Si peak, allowing low abundance spectra to be collected more reliably near or at 520 cm-1 wavenumbers. Additionally, Au-SiN can be used with IR spectroscopy if Raman is not available. Always start with the lowest power settings (i.e., laser intensity) on the instrument and then gradually increase, as some particles of interest can be fragile, such as oxidized particles, and may be damaged or destroyed by the laser.
When analyzing chosen particles with Raman spectroscopy, determining the reliability of a returned spectrum is crucial. Some particles may auto-fluoresce, and this fluorescence will add noise into the spectral measurement that may mask or complicate particle signal interpretation. This noise will take the form of a high-intensity band that spans a wide range of wavenumbers, conflating the underlying data. Proper spectra, demonstrated in Figure 3C and Figure 4C,D, even before baseline correction, will have clearly defined peaks across shorter spans of wavenumbers. If no peaks arise that are at least three times larger than any of the surrounding signals, then it is likely that the collected spectra are either background noise, or that different instrument settings are required to analyze the particle in question. Ensure the proper laser wavelength is selected for each sample. Lower wavelength lasers, such as a 532 nm laser, cannot sufficiently handle the signal generated by fluorescence. A higher wavelength laser, such as a 782 nm or 830 nm laser, can sufficiently ignore enough of the fluorescence to return a spectrum. Depending on the type of sample, different lasers will be suitable for different particle types, and if possible, may be interchanged during data collection on a single filter disk.
To determine the composition of particles, their collected spectra are compared to those in a reference spectra database. Reliable identification of a given particle spectra will yield a Pearson's coefficient (r) greater than 70% (r > 0.70). Suboptimal Raman data is shown in Figure 5B, where r < 0.70. MP identification results are useful in determining potential sources of MP pollution. To display particle identification results, an image and spectra of the analyzed particle can be shown as in Figure 3C and Figure 4C.
Scanning electron microscopy
Both SiN and Au-SiN filter disks are compatible with SEM immediately after particle capture by filtration. If the SiN filter disks are not coated with Au or Pt prior to SEM and after particle capture, some particles may be more readily "charged-up" by the ionization beam of the SEM, which may cause the particle to either glow or appear very bright in images. This brightness/glowing can cause issues with visualization due to poor contrast, such as masking the morphology of the particle. To mitigate, perform optical/fluorescence microscopy and Raman spectroscopy before SEM to mark any hard-to-analyze or small particles of interest for later SEM/EDX analysis, then coat the nanomembrane with Au or Pt as outlined in protocol section 7, and perform SEM/EDX.
Coating SiN or Au-SiN with Au or Pt after particle capture and prior to SEM analysis aids in the prevention of this charge-up effect during imaging, as particles are now no longer susceptible to ionization under the disposed metal layer. This coating improves contrast and resolution, so a greater morphological understanding of a given particle can be obtained, as seen in Figure 3D (fiber vs fragment) or surface morphologies, such as pits and fissures on oxidized particles. Metal coating particles prior to SEM analysis will permanently prevent them from being further analyzed with spectroscopy or fluorescence imaging, rendering only SEM/EDX analyses still possible. Coating the particles and performing SEM/EDX thus should be the final steps in any process if intended.
EDX measurements may be performed on captured particles both before and after metal coating. EDX can reveal the specific elemental composition of a given particle or area, which pairs well with any particles that are smaller than the size limit of detection for Raman analysis, or elemental compositions that can be difficult to analyze with certain Raman laser wavelengths such as metal, alloys, water-saturated particulates, and particles that fluoresce strongly when exposed to the Raman laser beam(s) available for use. In this study, particles were coated with a 6 nm-thick layer of Au. SEM imaging was done between 200x-3,000x magnification with a 20 kV beam power and focal length of 5 mm. Respective SEM images of selected particles are shown in Figure 3D.
Representative EDX results are shown in Figure 3F. Elements detected with a percent weight less than 1% can be considered trace or unreliable depending on the sensitivity of the instrument; therefore, we set a threshold at 1%. If selected particles for EDX analysis were coated, a detectable amount of the coating will be present in the elemental data report. If using uncoated SiN filter disks, Si and N signals will be observed, as shown in Figure 3F. Most synthetic polymer particles will also contain the elements C, H, and O, unfortunately, as most non-synthetic particles from biological sources are also made of the same elements, but non-synthetic particles could also include elements such as S, as in the case of proteins. This similarity in composition is why the counterstaining method with Nile Red and Trypan Blue is useful for differentiating between synthetic vs. non-synthetic particles, but is not an exhaustive identification tool, as Nile Red is also capable of staining non-synthetic particles in certain cases as well. Additional analysis parameters as the ones suggested above should be utilized in conjunction with any staining procedures to confirm results. Additionally, EDX can be a useful tool for potentially identifying particles that are outside of the size limit of detection for Raman spectroscopy (i.e., nanoplastics measuring < 1 µm).

Figure 1: SNAP pipelines. (A) Schematics of SNAP pipelines, characterizing the same particles on the same nanomembrane via a series of different analytical techniques. Pipeline A) demonstrates 1) Captured particles of interest from drinking water samples via vacuum filtration are 2) stained with Nile Red and Trypan Blue for differentiation of synthetic versus non-synthetic polymeric particles, respectively, followed by 3) particle identification via Raman spectroscopy, and 4) SEM/EDX to characterize particle morphology and elemental identification. Pipeline B) demonstrates 1) Particle capture onto Au-SiN followed by 2) Raman spectroscopy. Pipeline C) demonstrates 1) Particle capture onto Au-SiN followed by SEM/EDX. (B) Schematic of the filter disk and silicone gasket in the filtration setup in the vacuum apparatus, depicting the sequential filtration through a 20 µm MPSN, then 8.0 µm MSSN nanomembrane, separated by silicone gaskets. Abbreviations: SNAP = Silicon Nanomembrane Analysis Pipeline; SEM = scanning electron microscopy; EDX = energy-dispersive X-ray spectroscopy; MPSN = microporous Silicon nitride. Please click here to view a larger version of this figure.

Figure 2: Drinking water sample collection sources. A regional map published by the Monroe County Water Authority depicting the locations from which each of the four drinking water samples were collected in the Greater Rochester, NY, region. Samples originated from different surface water sources: Lake Ontario (blue), Hemlock Lake (green), both Hemlock Lake and Lake Ontario (yellow), and Canandaigua Lake (purple). Please click here to view a larger version of this figure.

Figure 3: Summary of analyses from SNAP Pipeline A performed on particles captured from drinking water samples. (A) Greyscale image of captured particles from one representative drinking water sample on a 20 µm cut-off SiN. (B) False colored overlay image of counterstained particles to represent Nile Red (false-colored red particles) and Trypan Blue (false-colored blue particles). (C) Reference (red) and collected (white) Raman spectra identifying a Nile Red-stained particle as polyethylene with Pearson's r value of 0.97, with representative image of the particle analyzed. (D) Electron micrograph of two different particle types demonstrating particle morphology analysis of a fiber (top panel) and fragment (bottom panel), both taking up the Trypan Blue stain. (E) Quantification of Nile Red-stained particles sequentially captured onto both 20 µm and 8 µm cut-off nanomembranes. (F) Summarized EDX elemental analysis of a randomly selected fragment and analytical details of the results with representative SEM image of the particle analyzed. Abbreviations: SNAP = Silicon Nanomembrane Analysis Pipeline; SEM = scanning electron microscopy; EDX = energy-dispersive X-ray spectroscopy. Please click here to view a larger version of this figure.

Figure 4: Summary of analyses from SNAP Pipeline B performed on particles captured from drinking water samples. Raman spectral analysis of three randomized particles from four household drinking water samples captured on 20 µm MPSN and 8.0 µm MSSN Au-SiN filter disks. Representative darkfield images of the total active membrane area for the 20 µm and 8 µm Au-SiN are respectively shown in A and B. Particles appear yellow in this imaging mode while the background remains dark, allowing for ease of automated particle counting. Representative Raman spectra of synthetic and non-synthetic particles on (C) 20 µm and (D) 8.0 µm Au-SiN. Total particle counts for (E) 20 µm and (F) 8.0 µm Au-SiN are binned by size ranges determined by the automated particle finding software. Abbreviations: SNAP = Silicon Nanomembrane Analysis Pipeline; SEM = scanning electron microscopy; EDX = energy-dispersive X-ray spectroscopy; MPSN = microporous Silicon nitride; MSSN = microslit Silicon nitride. Please click here to view a larger version of this figure.

Figure 5: Suboptimal fluorescence Imaging and Raman spectroscopy results. (A) A suboptimal fluorescence image of stained particles (left panel), where the membrane retained the Nile Red stain, likely from under-rinsing. Two particles, a Trypan Blue-stained fiber and a Nile Red-stained fragment (right panel), were selected for Raman spectroscopy. (B) Suboptimal Raman spectroscopy results where the Pearson's coefficient (r) is less than 70 % (r < 0.70). Please click here to view a larger version of this figure.
Supplemental Table S1: Properties of silicon nanomembranes within filter disks. Depicted in this table are the properties of the membranes within the SiN filter disks, including the minimum pore size, the percent porosity, the thickness of the membranes with and without Au coating, the active area of the membrane, and the gas permeance through the membrane with positive pressure applied at a set constant pressure. Cut-off (i.e., pore size), porosity, thickness, and membrane area determined by measuring features on SEM images. Gas permeance data are reported as mean ± standard deviation (n = 10) for N 2 positive pressure applied at 103.42 kPa. Abbreviations: Au = Gold; Six Ny = Non-stoichiometric Silicon Nitride. Please click here to download this File.
Supplemental Table S2: ParticleFinder particle counts and parameters. Whole membrane area image mosaics were taken of each sample, and each image mosaic was analyzed to collect total particle counts. Depicted in this table are the parameters used and in what order to determine total particle counts for each sample image, and particle counts at given size fractions. Parameters vary from sample to sample given the type, quantity, and shape of particles, as well as the specific reflectivity of each membrane during imaging. The data from this table is visualized in Figure 4. Please click here to download this File.