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State-of-the-art Electron Microscopy for Physical Sciences Research

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Michael Zachman

Michael Zachman

Oak Ridge National Laboratory, Center for Nanophase Materials Sciences

Dr. Zachman is a Staff Scientist in the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory. He received his BS in Physics from Purdue University in 2012, and his PhD in Applied Physics from Cornell University in 2018. Michael’s research interests lie in advancing electron microscopy techniques to enable understanding of the structure and properties of quantum and energy materials down to the atomic scale. His doctoral work concentrated on developing cryogenic focused ion beam and analytical cryogenic scanning transmission electron microscopy techniques to study solid-liquid interface processes at high spatial resolution with liquids intact. He applied these techniques to energy materials and energy storage devices to gain unique insights into processes such as dendrite and solid-electrolyte interphase layer formation in lithium metal batteries. Michael's postdoctoral research concentrated on developing and applying multi-dimensional STEM techniques and monochromated electron energy-loss spectroscopy to two-dimensional and battery materials to study their structure and properties at the nanometer and atomic scales. Michael's research currently focuses on adapting and pairing techniques like these to enhance understanding of the processes that govern fuel cell material performance and degradation, to enable development of new materials and improvement of existing materials.

Collection Overview

Recent years have seen rapid development of electron microscopy techniques for a variety of fields. The physical sciences, in particular, have seen a large number of techniques developed to enable both new information about samples to be obtained and new types of samples to be characterized. These techniques have allowed a wide range of materials properties to be measured, such as three-dimensional structure at the atomic-scale, nanoscale strain distributions with picometer precision, electromagnetic field distributions, and localized vibrational and optical properties. In addition, other techniques have enabled improved spatial resolution beyond that which standard aberration correction enables, and have provided access to new regions of phase diagrams, such as low temperature electronic phases and intact solid-liquid interfaces. This collection will cover the electron microscopy techniques that provide these abilities, including tomography, differential phase contrast, ptychography, monochromated EELS, and cryogenic FIB/SEM and STEM, which are poised to make significant contributions across a wide range of scientific fields.

Editorial

State-of-the-Art Electron Microscopy For Physical Sciences Research

State-of-the-Art Electron Microscopy For Physical Sciences Research

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2023

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Articles

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Abstracts

Integrated Differential Phase Contrast STEM (iDPC-STEM): Practical aspects and conditions

Ivan Lazić*1,

Eric G.T. Bosch2,

Stefano Vespucci2

1Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands,

2Thermo Fischer Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands

Strain quantification with 4D-STEM

Raymond Unocic*1,

Debangshu Mukherjee*1

1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory