As the sharp probe scans, forces between its tip and the sample bend the cantilever. The instrument detects this deflection and compares it with a defined force. A feedback system then adjusts the probe height to maintain that force, while the required height changes provide information about nanoscale surface topography.
The defined force establishes a consistent interaction between the probe and the specimen during scanning. Maintaining that condition allows cantilever deflection to be interpreted alongside probe-height changes, helping researchers characterize surface organization and structural features across biological samples rather than relying on a single local measurement.
The probe responds to interactions at the sample surface, and those responses are recorded during scanning. Consequently, the resulting measurements can describe nanoscale topography while also revealing mechanical features and differences in surface organization. This combination is useful for studying both the physical arrangement and structural properties of biological specimens.
A sharp probe is positioned against the sample so that it remains in continuous contact during scanning. As the probe moves across the surface, the system monitors cantilever deflection, applies feedback to maintain the selected force, and records the corresponding probe-height adjustments. These recorded changes are used to characterize the scanned surface.
The method can be applied to cell membranes, biomolecular assemblies, and other biological specimens that may be soft or rigid. This range makes it suitable for investigating nanoscale surface organization across different types of biological material, rather than restricting analysis to one specimen class or one physical state.
Measurements can provide information about surface organization, mechanical features, and structural changes. In biology, those outcomes support research in cell biology, microbiology, and biomaterials. Researchers can therefore use the technique to examine how biological surfaces and assemblies are arranged or how their observable structure differs across specimens.