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Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
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Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

DOI:
10.3791/64823-v

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05:34 min

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June 30, 2023

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, , , ,
1Centro Universitario de los Lagos,Universidad de Guadalajara, 2Centro Nacional de Recursos Genéticos,Instituto Nacional de Investigaciones Forestales, Agrícolas y Pecuarias

Chapters

  • 00:04Introduction
  • 00:31Bacterial Sample Preparation and AFM Measurements
  • 03:10Results: Atomic Force Contact Microscopic Analysis of Bacterial Cultures Under Nanoparticle Influence
  • 04:46Conclusion

Summary

Automatic Translation

Automatic Translation

Here, we present the application of atomic force microscopy (AFM) as a simple and fast method for bacterial characterization and analyze details such as the bacterial size and shape, bacterial culture biofilms, and the activity of nanoparticles as bactericides.

Tags

Keywords: Contact Mode Atomic Force MicroscopyMorphological ObservationBacterial Cell Damage AnalysisFixed SampleContact ModeContAI-G ProbesAuto SlopeZ ControllerScan RangeXY PlaneLine By Line LevelingStaphylococcus AureusCocci AggregatesPopulation DistributionCocci Morphology

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