Afm Conductivity Measurements
Afm Conductivity Measurements - Related Videos
08:59
Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM
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Cited by 3 •
2013
Organic photovoltaic (OPV) materials are inherently inhomogeneous at the nanometer scale. Nanoscale inhomogeneity of OPV materials affects performance of photovoltaic devices. In this paper, we describe a protocol for quantitative measurements of electrical and mechanical properties of OPV materials with sub-100 nm resolution.
08:21
Quantitative Hardness Measurement by Instrumented AFM-indentation
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Cited by 6 •
2016
This experimental protocol describes how atomic force microscopy can be used to measure hardness at the true nanometer scale and to detect single atomistic plasticity events.
09:47
AFM and Microrheology in the Zebrafish Embryo Yolk Cell
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Cited by 3 •
2017
The lack of tools to measure material properties and tensional parameters in vivo prevents validating their roles during development. We employed atomic force microscopy (AFM) and nanoparticle-tracking to quantify mechanical features on the intact zebrafish embryo yolk cell during epiboly. These methods are reliable and widely applicable avoiding intrusive interventions.
12:11
Measurement of Leaf Hydraulic Conductance and Stomatal Conductance and Their Responses to Irradiance and Dehydration Using the Evaporative Flux Method (EFM)
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Cited by 105 •
2012
We describe a relatively rapid (30 min) and realistic method for simultaneously measurement of leaf hydraulic conductance (Kleaf) and stomatal conductance (gs) for transpiring excised leaves. The method can be modified to measure the light and dehydration responses of Kleaf and gs.
08:29
Au-Interaction of Slp1 Polymers and Monolayer from Lysinibacillus sphaericus JG-B53 - QCM-D, ICP-MS and AFM as Tools for Biomolecule-metal Studies
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Cited by 12 •
2016
To obtain basic information on the sorption and recycling of gold from aqueous systems the interaction of Au(III) and Au(0) nanoparticles on S-layer proteins were investigated. The sorption of protein polymers was investigated by ICP-MS and that of proteinaceous monolayers by QCM-D. Subsequent AFM enables the imaging of the nanostructures.
FAQs
The conductive probe senses electrical current at individual locations while the instrument records the corresponding surface topography. Comparing these two spatially aligned signals shows whether electrical variations coincide with visible structural features. This relationship can reveal localized behavior associated with defects, interfaces, composition changes, or differences introduced during material processing.
An applied voltage establishes the electrical circuit between the conductive probe and the sample. As the probe scans, the resulting current changes according to local electrical behavior, allowing the measurement to distinguish regions with different conductivity. Without this controlled electrical bias, the probe could resolve surface structure but could not produce the current map.
Electrical information becomes more useful when interpreted alongside nanoscale surface structure. A current variation may align with a defect, an interface, a compositional region, or a processing-related feature. Recording both signals during the same scan helps researchers associate local electrical performance with physical location, rather than treating conductivity as an isolated material property.
The sample and conductive probe are arranged so that the probe contacts or approaches the surface, and an applied voltage establishes a measurable circuit. The probe then scans across the selected region while the instrument records current and surface topography. Researchers compare the resulting maps to locate and interpret spatial variations in electrical behavior.
In engineering research, the technique supports examination of semiconductors, thin films, nanomaterials, and electronic devices. Its nanoscale measurements can expose electrical nonuniformity that broader measurements may not localize. By relating current patterns to surface features, researchers can evaluate material behavior and investigate how structure or processing affects device-relevant performance.
Localized current patterns can help identify possible failure sites or regions with unusual electrical behavior in engineered materials and devices. Comparing those regions with topographic features provides evidence for linking performance problems to defects, interfaces, composition, or fabrication history. This information can guide evaluation of device performance and optimization of materials or processing conditions.