X-ray Rocking Curves
X-ray Rocking Curves - Related Videos
10:36
Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction
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Cited by 1 •
2018
We report detailed procedures for compression experiments on rocks and mineral aggregates within a multi-anvil deformation apparatus coupled with synchrotron X-radiation. Such experiments allow quantification of the stress distribution within samples, that ultimately sheds light on compaction processes in geomaterials.
10:39
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Cited by 10 •
2016
The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.
07:54
Preparing Adherent Cells for X-ray Fluorescence Imaging by Chemical Fixation
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Cited by 14 •
2015
Here, we present a protocol on how to determine the quantity and distribution of metals in a sample using synchrotron X-ray fluorescence. We focus on adherent cells, and describe the chemical fixation method to prepare this sample. We then describe how to mount and image the sample using synchrotron X-rays.
10:12
Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Cited by 8 •
2018
We describe a beamline setup meant to carry out rapid two-dimensional x-ray fluorescence and x-ray microdiffraction mapping of single crystal or powder samples using either Laue (polychromatic radiation) or powder (monochromatic radiation) diffraction. The resulting maps give information about strain, orientation, phase distribution, and plastic deformation.
09:26
Igneous Intrusive Rock
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2023
Source: Laboratory of Alan Lester - University of Colorado Boulder Igneous rocks are products of the cooling and crystallization of high temperature liquid rock, called magma. Magmatic temperatures typically range from approximately 800 °C to 1,200 °C. Molten rock is, perhaps luckily for humans, an anomaly on planet Earth. If a random and imaginary drill hole were made in the Earth, it would most likely not reach a region of truly and totally molten material until the outer core, at nearly...
FAQs
The peak position provides information about lattice spacing and crystal orientation. A change in this position can therefore indicate that the measured material differs in its structural alignment or spacing from an expected condition. In engineering measurements, tracking peak position helps assess whether a wafer, epitaxial film, or other crystalline material has the intended crystallographic characteristics.
Peak width and overall shape provide complementary information about material quality. They can reveal variations associated with strain, mosaicity, and defects, rather than only identifying the central diffraction condition. Examining these features allows engineers to distinguish a sharply defined structural response from one indicating greater structural nonuniformity or imperfections within the crystalline material.
Keeping the detector positioned for the selected diffracted beam allows the measurement to track intensity as the incident angle changes. The resulting intensity profile shows how strongly the crystal satisfies the chosen Bragg reflection across the angular scan. This controlled geometry makes the peak position, width, and shape available for structural and quality assessment.
A measurement selects a Bragg reflection, positions the detector to collect its diffracted beam, and then rotates the crystal or wafer while changing the incident angle. The instrument records diffracted intensity throughout this angular range. Engineers then examine the resulting peak position, width, and shape to evaluate lattice spacing, orientation, strain, mosaicity, and defects.
They are useful when engineers need to evaluate the structural quality of semiconductor wafers or epitaxial thin films. The measurement can expose differences in orientation, lattice spacing, strain, mosaicity, or defects that affect crystalline performance. This makes rocking-curve analysis relevant during material evaluation and when assessing whether a fabricated layer or wafer meets structural expectations.
By providing measurable diffraction features linked to crystal structure and quality, rocking curves help engineers compare materials or processing conditions. Peak position, width, and shape can indicate whether structural characteristics are changing in a desirable or undesirable direction. These observations support process optimization, quality-control decisions, and development of devices that depend on precise crystalline properties.