Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Shashidhara Marathe; Xianbo Shi; Michael J. Wojcik; Albert T. Macrander; Lahsen Assoufid

doi:10.3791/53025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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10:39 min

October 11, 2016

DOI: 10.3791/53025-v

Shashidhara Marathe^1,2, Xianbo Shi¹, Michael J. Wojcik¹, Albert T. Macrander¹, Lahsen Assoufid¹

¹X-ray Science Division, Advanced Photon Source,Argonne National Laboratory, ²Division of Science,Diamond Light Source Ltd.

Overview

This article presents a method for measuring the transverse coherence of X-ray beams at synchrotron beamlines using grading interferometry. The technique allows for simultaneous measurement of coherence properties in multiple directions through the use of 2D phase gratings.

Key Study Components

Area of Science

Neuroscience
Physics
Materials Science

Background

Transverse coherence is crucial for characterizing X-ray sources.
Grading interferometry enables measurement in multiple directions.
2D phase gratings are essential for this technique.
The method can be applied across various synchrotron beamlines.

Purpose of Study

To measure the coherence properties of X-ray beams.
To demonstrate the application of 2D phase gratings in coherence measurement.
To provide a protocol for characterizing X-ray sources and optics.

Methods Used

Fabrication of a 2D phase grating using an electroplating mold.
Preparation of a silicon wafer as the starting point for grating creation.
Measurement of coherence properties at the 1-BM beamline of the Advanced Photon Source.
Application of the technique to any synchrotron beamline.

Main Results

The method successfully measures transverse coherence in multiple directions.
Demonstrated effectiveness at the Advanced Photon Source.
Provides a simple yet comprehensive characterization of X-ray sources.
Highlights the importance of 2D gratings in coherence measurement.

Conclusions

This technique offers a robust method for X-ray coherence measurement.
It can be adapted for various synchrotron beamlines.
Future applications may enhance X-ray optics characterization.

Frequently Asked Questions

What is transverse coherence?

Transverse coherence refers to the correlation of the phase of light waves across a beam's cross-section, which is critical for imaging and diffraction applications.

How does grading interferometry work?

Grading interferometry utilizes phase gratings to split and recombine light waves, allowing for the measurement of coherence properties.

What are the advantages of using 2D phase gratings?

2D phase gratings enable simultaneous measurement of coherence in multiple directions, improving the efficiency and comprehensiveness of the analysis.

Can this method be used at any synchrotron beamline?

Yes, while demonstrated at the Advanced Photon Source, the technique is applicable to any synchrotron beamline.

What materials are needed for the phase grating fabrication?

The primary material used is a silicon wafer, which serves as the substrate for the electroplating mold.

What is the significance of measuring coherence properties?

Measuring coherence properties is essential for optimizing X-ray imaging and diffraction techniques, impacting various scientific fields.

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.

The overall goal of this procedure, is to measure the transverse coherence of the X-ray beam, at a synchrotron beamline, using grading interferometery. The main advantage of this technique, is that it can measure the coherence property of X-ray beam, in multiple directions, simultaneously, by using 2D gradients. Though, the method was demonstrated at the 1-BM beamline, at the Advanced Photon Source, it can be applied to any synchrotron beamline.

The manufacture of a 2D gratings, is critical to measure different beamline coherent conditions. The creation of the phase grating, first requires fabrication, of an electroplating mold. The starting point for this demonstration, is a prepared piece of silicon wafer.

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