Sub-nanometer Resolution
Sub-nanometer Resolution - Related Videos
10:25
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Cited by 39 •
2016
We present a method for achieving sub-nanometer resolution images with amplitude-modulation (tapping mode) atomic force microscopy in liquid. The method is demonstrated on commercial atomic force microscopes. We explain the rationale behind our choices of parameters and suggest strategies for resolution optimization.
11:56
Fluorescence Imaging with One-nanometer Accuracy (FIONA)
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Cited by 11 •
2014
Single fluorophores can be localized with nanometer precision using FIONA. Here a summary of the FIONA technique is reported, and how to carry out FIONA experiments is described.
08:31
Three-dimensional Optical-resolution Photoacoustic Microscopy
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Cited by 27 •
2011
Optical-resolution photoacoustic microscopy (OR-PAM) is an emerging technology capable of imaging optical absorption contrasts in vivo with cellular resolution and sensitivity. Here, we provide a visualized instruction on the experimental protocols of OR-PAM, including system configuration, system alignment, typical in vivo experimental procedures, and functional imaging schemes.
16:52
Test Samples for Optimizing STORM Super-Resolution Microscopy
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Cited by 48 •
2013
We describe the preparation of three test samples and how they can be used to optimize and assess the performance of STORM microscopes. Using these examples we show how to acquire raw data and then process it to acquire super-resolution images in cells of approximately 30-50 nm resolution.
08:47
Super-resolution Imaging of the Bacterial Division Machinery
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Cited by 17 •
2013
We describe a super-resolution imaging method to probe the structural organization of the bacterial FtsZ-ring, an essential apparatus for cell division. This method is based on quantitative analyses of photoactivated localization microscopy (PALM) images and can be applied to other bacterial cytoskeletal proteins.
FAQs
Achieving sub-nanometer resolution requires more than a nominal instrument scale. A highly localized probe or short-wavelength signal interacts with the feature, while precise positioning controls where information is collected. Environmental stability limits unwanted motion, and analysis must distinguish real nanoscale structure from instrument noise. These conditions work together to make measurements interpretable.
The distinction depends on combining controlled measurement conditions with analytical separation of signal and noise. Precise positioning helps maintain consistent feature localization, while environmental stability reduces disturbances that could mimic structural detail. Analysis then tests whether observed variations represent genuine nanoscale features rather than instrument behavior, improving confidence in surface or material characterization.
At near-atomic scales, small unwanted movements can obscure or alter the feature being examined. Precise positioning keeps the probe or signal aligned with the intended location, while environmental stability reduces disturbances during measurement. Together, they preserve the spatial information needed to evaluate fabrication tolerances, surface structure, or other nanoscale characteristics.
A practical workflow begins by selecting a localized probe or short-wavelength signal suited to the feature of interest. Engineers then establish precise positioning and stable environmental conditions before collecting measurements. The resulting data require analysis that separates genuine nanoscale features from instrument noise. This sequence supports reliable interpretation rather than treating every detected variation as structural information.
Engineering applications include scanning probe and electron microscopy, surface metrology, semiconductor inspection, and nanomaterial characterization. The capability is also useful for evaluating fabrication tolerances, where very small structural differences may affect device or material behavior. These applications allow researchers to examine matter at a scale relevant to manufacturing quality and nanoscale design.
Near-atomic characterization helps researchers relate observed structure to electrical, mechanical, and chemical performance. In semiconductor inspection, surface metrology, and nanomaterial studies, measurements can reveal whether nanoscale features or fabrication variations correspond to functional differences. This connection makes the technique valuable not only for imaging or measurement, but also for evaluating how structure influences engineered systems.