Surface Potential Microscopy
Surface Potential Microscopy - Related Videos
10:49
Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy
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Cited by 17 •
2014
Here, we present a protocol explaining the use of Kelvin probe force microscopy as a tool for generating high resolution nano-scale surface potential maps. This tool was applied to assess the role of surface potential on the binding capacity of microorganisms to substrate surfaces.
06:41
Light Sheet Fluorescence Microscopy of Plant Roots Growing on the Surface of a Gel
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Cited by 24 •
2017
This protocol shows a plant sample preparation method for light-sheet microscopy. The setup is characterized by mounting the plant vertically on the surface of a gel and letting it grow in controlled bright conditions. This allows long-term observation of plant organ development in standardized conditions.
08:43
Simultaneous Measurement of Mitochondrial Calcium and Mitochondrial Membrane Potential in Live Cells by Fluorescent Microscopy
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Cited by 29 •
2017
Mitochondria can utilize the electrochemical potential across their inner membrane (ΔΨm) to sequester calcium (Ca2+), allowing them to shape cytosolic Ca2+ signaling within the cell. We describe a method for simultaneously measuring mitochondria Ca2+ uptake and ΔΨm in live cells using fluorescent dyes and confocal microscopy.
02:14
Microscopy-Based Evaluation of Bacterial Attachment to Plant Root Surfaces
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2026
Source: Matthysse, A. G. Adherence of Bacteria to Plant Surfaces Measured in the Laboratory. J. Vis. Exp. (2018).This video demonstrates the evaluation of bacterial attachment to plant roots using phase-contrast microscopy. Root samples from seedlings incubated with bacteria are first mounted to check for free bacteria. The samples are then washed to remove loosely attached bacteria and remounted using a suitable coverslip to prevent damage. Finally, the number of bacteria attached to the root...
06:31
Real-time Imaging of Plant Cell Surface Dynamics with Variable-angle Epifluorescence Microscopy
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Cited by 10 •
2015
The goal of this protocol is to demonstrate how to monitor fluorescently-tagged protein dynamics on plant cell surfaces with variable-angle epifluorescence microscopy, showing blinking dots of GFP-tagged PATROL1, a membrane trafficking protein, in the cell cortex of the stomatal complex in Arabidopsis thaliana.
FAQs
The applied voltage creates electrostatic interactions between the conductive atomic force microscope tip and the sample surface. Feedback then changes the voltage until the electrostatic force is nulled. The voltage required for this balance provides the contact potential difference, allowing local electrical variations to be represented across the scanned material rather than treated as a single bulk measurement.
Contact potential difference identifies local electrical contrasts between the tip and different regions of the sample. These contrasts can be associated with variations in work function, charge distribution, defects, or contamination. Mapping them helps engineers connect nanoscale surface nonuniformity with interfacial behavior and possible changes in the electrical performance of semiconductors, thin films, or devices.
Controlled tip vibration helps generate the electrostatic interactions needed for the measurement as the conductive tip scans the surface. Because the interaction is coupled with applied-voltage control and feedback, the system can adjust the voltage toward a force-null condition. This approach supports spatial mapping of potential differences across regions that may differ in electrical or interfacial properties.
A typical workflow places a conductive atomic force microscope tip over the material, scans it across the surface, applies a voltage, and controls the tip vibration. During scanning, feedback adjusts the applied voltage to null the electrostatic force. The resulting voltage response is used to map contact potential differences and compare electrical behavior from one surface region to another.
Engineering studies can apply the technique to semiconductors, photovoltaic materials, thin films, corroding surfaces, and electronic interfaces. In each case, the map supplies local electrical information that complements broader device or material measurements. This makes it useful for examining how surface potential variations relate to interfacial behavior and electrical performance in engineered systems.
Spatial variations in the maps can point to regions affected by defects, contamination, altered work function, or uneven charge distribution. Engineers can compare these local patterns with device performance or interface behavior to identify electrically significant nonuniformity. The same approach also supports corrosion studies, where surface-potential differences provide information about local changes across the material.