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Använda Synchrotron Radiation Microtomography att undersöka Multi skala Tredimensionella Microelectronic paket
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Använda Synchrotron Radiation Microtomography att undersöka Multi skala Tredimensionella Microelectronic paket

Article DOI: 10.3791/53683-v • 08:46 min • April 13th, 2016
April 13th, 2016 •
1, 1, 2, 2, 2, 3, 3
1Materials Engineering Division, Lawrence Livermore National Laboratory, 2Assembly Test and Technology Development Failure Analysis Labs, Intel Corporation, 3Advanced Light Source, Lawrence Berkeley National Laboratory

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För denna studie synkrotronstrålning mikro-tomografi, en icke-förstörande tredimensionell avbildningsteknik, används för att undersöka en hel mikroelektroniska paket med en tvärsnittsarea på 16 x 16 mm. På grund av synkrotron höga flöde och ljusstyrka provet avbildades på bara tre minuter med en 8,7 um rumslig upplösning.

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Engineering Synkrotronljus mikro tomografi röntgen datortomografi icke-förstörande felanalys blyfri lod och tre-dimensionella mikro paket
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