Atomic Resolution Imaging
Atomic Resolution Imaging - Related Videos
10:25
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Cited by 39 •
2016
We present a method for achieving sub-nanometer resolution images with amplitude-modulation (tapping mode) atomic force microscopy in liquid. The method is demonstrated on commercial atomic force microscopes. We explain the rationale behind our choices of parameters and suggest strategies for resolution optimization.
05:31
Sample Preparation for Single Virion Atomic Force Microscopy and Super-resolution Fluorescence Imaging
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Cited by 4 •
2014
The attachment of virions to a surface is a requirement for single virion imaging by Super-resolution fluorescence imaging or atomic force microscopy (AFM). Here we demonstrate a sample preparation method for controlled adhesion of virions to glass surfaces suitable for use in AFM and super-resolution fluorescence imaging.
10:03
Bacterial Immobilization for Imaging by Atomic Force Microscopy
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Cited by 36 •
2011
Live Gram-negative and Gram-positive bacteria can be immobilized on gelatin-coated mica and imaged in liquid using Atomic Force Microscopy (AFM).
02:28
Imaging Polysomes Isolated from a Mouse Brain Using Atomic Force Microscopy
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2025
Source: Lunelli, L., et. al. Peering at Brain Polysomes with Atomic Force Microscopy. J. Vis. Exp.(2016).This video demonstrates the imaging of polysomes using atomic force microscopy. A nickel-ions-coated mica sheet anchors RNA with attached ribosomes. The sample is washed, dried, and mounted onto the microscope stage. The cantilever tip scans the sample surface, recording laser deflections to map the topology. Software is used to correct distortions and visualize high-resolution polysome...
10:06
High-resolution Functional Magnetic Resonance Imaging Methods for Human Midbrain
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Cited by 8 •
2012
This article describes techniques to perform high-resolution functional magnetic resonance imaging with 1.2 mm sampling in human midbrain and subcortical structures using a 3T scanner. Use of these techniques to resolve topographic maps of visual stimulation in the human superior colliculus (SC) is given as an example.
FAQs
Electron-based instruments use a focused beam and measure how electrons scatter as they pass through a thin specimen. Probe-based instruments instead move a sharp probe across a surface and record local interactions. These different measurement principles determine whether the resulting contrast primarily represents structure through a specimen or variations at its exposed surface.
These features show where a material’s atomic arrangement departs from an ideal structure. Defects can reveal potential sources of failure, while interfaces and lattice distortions indicate how neighboring regions interact. Observing them helps engineers relate local structural changes to material properties and evaluate whether a designed architecture supports the intended performance.
A focused electron beam requires a thin specimen so transmitted electron scattering can be measured. A sharp-probe approach examines local interactions across a surface, making the exposed surface the relevant measurement region. Thus, the available specimen form and the structural region of interest help determine which approach can provide useful atomic-scale information.
First, engineers select an imaging approach that matches the specimen geometry and the feature under study. They then measure electron scattering through a thin specimen or map local surface interactions with a sharp probe. Finally, they interpret atomic-scale contrast to identify defects, interfaces, lattice distortions, or chemical variations and relate those observations to material behavior.
Engineers can use it when a material or device fails and the suspected cause may involve changes at the atomic scale. Images can expose defects, interfaces, lattice distortions, or chemical variations that are not captured by broader structural descriptions. This evidence helps connect the observed failure to local material architecture and informs later process or design decisions.
In these applications, performance depends strongly on controlled atomic architecture. Atomic-scale images provide structural information about the relevant material regions, including interfaces, defects, lattice distortions, and chemical variations. Engineers can use those observations to evaluate processing, guide device development, optimize materials, and design structures whose properties depend on precise atomic organization.