Phase Grating Interferometer
Phase Grating Interferometer - Related Videos
10:39
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Cited by 10 •
2016
The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.
08:48
Writing Bragg Gratings in Multicore Fibers
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Cited by 3 •
2016
We describe a technique for inscribing identical fiber Bragg gratings into each core of a multicore fiber. This is achieved by introducing an additional surface into the optical path to mitigate lensing by the curved surface of the fiber cladding.
16:11
Implementation of a Reference Interferometer for Nanodetection
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2014
A reference interferometer technique, which is designed to remove undesirable laser jitter noise for nanodetection, is utilized for probing an ultra-high quality factor microcavity. Instructions for assembly, setup, and data acquisition are provided, alongside the measurement process for specifying the cavity quality factor.
12:08
Fabrication of High Contrast Gratings for the Spectrum Splitting Dispersive Element in a Concentrated Photovoltaic System
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2015
The fabrication of high contrast gratings as the parallel spectrum splitting dispersive element in a concentrated photovoltaic system is demonstrated. Fabrication processes including nanoimprint lithography, TiO2 sputtering and reactive ion etching are described. Reflectance measurement results are used to characterize the optical performance.
02:39
Phase Diagrams
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2020
A phase diagram combines plots of pressure versus temperature for the liquid-gas, solid-liquid, and solid-gas phase-transition equilibria of a substance. These diagrams indicate the physical states that exist under specific conditions of pressure and temperature and also provide the pressure dependence of the phase-transition temperatures (melting points, sublimation points, boiling points). Regions or areas labeled solid, liquid, and gas represent single phases, while lines or curves represent...
FAQs
The grating creates several diffracted orders from the incident beam, rather than producing a single transmitted or reflected component. As these orders travel, their wavefronts overlap after an appropriate propagation distance. Their relative phase then determines the local interference pattern, so the recorded structure carries information that is not present in any one order alone.
A specimen or component changes the beam’s optical path, and that change shifts the interference pattern. The system does not read phase directly as a separate signal; it infers phase-related information from intensity changes. Calibrated analysis or controlled scanning converts those measured shifts into a usable phase measurement.
The diffracted orders must overlap after propagation over a suitable distance to form the structured pattern. If they have not yet overlapped, their interference cannot provide the intended measurement. The propagation arrangement therefore belongs to the measurement geometry, because the recorded intensity pattern depends on how the orders combine during data collection.
An engineering measurement can begin by directing the incident beam onto the periodic grating, allowing the diffracted orders to propagate and overlap, and placing the specimen or component so it modifies the beam’s optical path. The resulting intensity pattern is recorded, then interpreted with calibrated analysis or controlled scanning to recover phase information.
Relevant engineering applications include nondestructive inspection, surface and dimensional metrology, material characterization, and phase-contrast imaging. These uses are valuable when a component, surface, or material must be evaluated without relying on destructive examination. Pattern shifts provide a basis for detecting defects and subtle structural variations.
Pattern shifts can indicate defects or subtle structural variations because both can alter the beam’s optical path. The measured outcome is therefore not merely a brightness image: it is an intensity record that supports recovery of phase information. In engineering, that distinction enables inspection and metrology based on changes in wavefront behavior.