Pump Beam Technique
Pump Beam Technique - Related Videos
09:30
Focused Ion Beams
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2023
Source: Sina Shahbazmohamadi and Peiman Shahbeigi-Roodposhti-Roodposhti, School of Engineering, University of Connecticut, Storrs, CT As electron microscopes become more complex and widely used in research labs, it becomes more of a necessity to introduce their capabilities. Focused ion beam (FIB) is an instrument that can be employed in order to fabricate, trim, analyze and characterize materials on mico- and nano-scales in a wide variety of fields from nano-electronics to medicine. FIB...
08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Cited by 10 •
2015
We describe the approaches for the device fabrication and electrical characterization of molybdenum diselenide (MoSe2) layer semiconductor nanostructures with different thicknesses. In addition, the fabrication of ohmic contacts for MoSe2-layer nanocrystals by the focused-ion beam deposition method using platinum (Pt) as a contact metal is described.
10:02
Submillisecond Conformational Changes in Proteins Resolved by Photothermal Beam Deflection
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Cited by 1 •
2014
Here we report an application of the photothermal beam deflection technique in combination with a caged calcium compound, DM-nitrophen, to monitor microsecond and millisecond dynamics and energetics of structural changes associated with the calcium association to a neuronal calcium sensor, Downstream Regulatory Element Antagonist Modulator.
01:30
Beams
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2023
Beams are integral components of structural engineering and construction, designed to support loads applied at various points along their length. These long, straight members can be classified based on geometry, cross-section, support type, and equilibrium condition. Based on geometry, beams can be straight, tapered, or curved. Straight beams are the most common type and have a constant cross-section throughout their length. Tapered beams, on the other hand, have a varying cross-section along...
10:54
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
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Cited by 5 •
2014
Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.
FAQs
The delivered energy can produce electronic excitation, heating, or changes in carrier populations. These effects move the system away from its initial state, creating a response that can be monitored through optical or electrical measurements. Comparing the measured response with the controlled excitation helps researchers connect a material or device property to the physical process responsible for its change.
Measuring the response over time reveals how the excited state develops and changes after energy delivery. A probe beam or detector records this evolution, allowing researchers to examine the dynamics of fast physical processes rather than only a final steady condition. This time-resolved information is particularly useful when evaluating energy transfer or transient device behavior.
Researchers can investigate responses associated with electronic excitation, heating, and altered carrier populations. These mechanisms affect the measured optical or electrical signal in different ways, so the experiment links the type of controlled excitation to the resulting response. This distinction supports interpretation of material properties and helps identify which state-changing process influences a device or optical system.
A researcher first directs an energy-delivering light beam at the material, device, or optical system to create a controlled change in state. The resulting response is then measured with a probe beam or detector, often as it evolves over time. The measured optical or electrical behavior is analyzed in relation to the applied excitation and the system under study.
Its applications include time-resolved spectroscopy, semiconductor characterization, laser development, and evaluation of energy-transfer processes. In these settings, controlled excitation provides a way to test how materials, devices, or optical systems respond. The resulting measurements can support assessment of material properties, device performance, and the dynamics of rapid physical processes.
The response can reveal material properties, device performance, and changes associated with energy transfer. Optical measurements are relevant when the system’s light-related behavior is being examined, while electrical measurements can show how excitation affects electrical response. Because the results are linked to a known pump condition, researchers can relate observed behavior to the system’s changed state.