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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

DOI:
10.3791/51463-v

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10:54 min

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July 26, 2014

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, , ,
1Department of Engineering Sciences,Uppsala University, 2Gatan Inc., 3Department of Microbiology,Swedish University of Agricultural Sciences, 4Physics Department,University of Oslo

Chapters

  • 00:05Title
  • 01:25Sample Freezing
  • 03:21Ion Milling
  • 05:56Cryo Transfer to TEM
  • 08:54Results: Visualization of Aspergillus niger Spores Using Cryo-microscopy
  • 10:20Conclusion

Summary

Automatic Translation

Automatic Translation

Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.

Tags

Keywords: Cryo-electron MicroscopyFocused Ion BeamSpecimen PreparationAspergillus NigerCryo-TEMCryo-SEMLamella ExtractionTEM GridElectron TransparencyCryo-transfer StationNanomanipulatorContamination

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