Journal
/
Engineering
/
Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons
JoVE Journal
Engineering
A subscription to JoVE is required to view this content.  Sign in or start your free trial.
JoVE Journal Engineering
Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

DOI:
10.3791/56735-v

•

07:39 min

•

July 21, 2018

•

, ,
1State Key Laboratory of Optoelectronic Materials and Technologies and Guangdong Province Key Laboratory of Display Material and Technology, School of Physics and Engineering,Sun Yat-sen University, 2Department of Physics,The Chinese University of Hong Kong

Chapters

  • 00:04Title
  • 00:27Periodic Array Preparation
  • 02:47Gold Film Deposition and Light Emitter Coating
  • 03:16Reflectivity Measurements for Determining the Surface Plasmon Polariton Decay Rates
  • 04:37Photoluminescence Measurements for Determining the Emission Power Ratio
  • 05:26Results: P-polarized Reflectivity and Photoluminescence Measurements of a Gold Array
  • 06:35Conclusion

Summary

Automatic Translation

Automatic Translation

This protocol describes the instrumentation for determining the excitation and coupling rates between light emitters and Bloch-like surface plasmon polaritons arising from periodic arrays.

Tags

Keywords: Surface Plasmon PolaritonsFluorescence EnhancementExcitation RateCoupling RatePeriodic ArrayPhotoresistSpin CoatingLloyd’s InterferometerRF SputteringStyryl 8 DyeReflectivity MeasurementGoniometer

Article

Embed

ADD TO PLAYLIST

Usage Statistics

Related Videos

check_url/56735?article_type=v

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
check_url/56735?article_type=v

Design, Fabrication, and Experimental Characterization of Plasmonic Photoconductive Terahertz Emitters
check_url/56735?article_type=v

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators
check_url/56735?article_type=v

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
check_url/56735?article_type=v

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
check_url/56735?article_type=v

Measurement of Outgassing Rates of Steels
check_url/56735?article_type=v

Resonance Fluorescence of an InGaAs Quantum Dot in a Planar Cavity Using Orthogonal Excitation and Detection
check_url/56735?article_type=v

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
check_url/56735?article_type=v

Excitation-Scanning Hyperspectral Imaging Microscopy to Efficiently Discriminate Fluorescence Signals
check_url/56735?article_type=v

Accurate Determination of the Equilibrium Surface Tension Values with Area Perturbation Tests

Read Article