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Journal / Chemistry / Preparazione di nanoparticelle per l'analisi…
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Preparazione di nanoparticelle per l'analisi ToF-SIMS e XPS
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Preparazione di nanoparticelle per l'analisi ToF-SIMS e XPS

Article DOI: 10.3791/61758-v • 06:24 min • September 13th, 2020
September 13th, 2020 •
1, 1, 1, 2, 2, 2, 2, 2
1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

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Vengono presentate diverse procedure per la preparazione di nanoparticelle per l'analisi superficiale (colata a goccia, rivestimento di spin, deposizione da polveri e criofissazione). Discutiamo le sfide, le opportunità e le possibili applicazioni di ciascun metodo, in particolare per quanto riguarda i cambiamenti nelle proprietà superficiali causati dai diversi metodi di preparazione.

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Chimica Numero 163 nanoparticelle preparazione del campione analisi delle superfici XPS ToF-SIMS spin-coating drop-casting criofissazione
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