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Journal / Chemistry / ToF-SIMS 및 XPS 분석을 위한 나노 입자 의…
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Chemistry

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JoVE Journal Chemistry
ToF-SIMS 및 XPS 분석을 위한 나노 입자 의 준비
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ToF-SIMS 및 XPS 분석을 위한 나노 입자 의 준비

Article DOI: 10.3791/61758-v • 06:24 min • September 13th, 2020
September 13th, 2020 •
1, 1, 1, 2, 2, 2, 2, 2
1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

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표면 분석을 위한 나노입자를 준비하기 위한 여러 가지 절차가 제시됩니다(낙하 주조, 스핀 코팅, 분말의 증착 및 극저온). 각 방법의 과제, 기회 및 가능한 응용 프로그램, 특히 서로 다른 준비 방법으로 인한 표면 속성의 변화에 대해 설명합니다.

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화학 문제 163 나노 입자 샘플 준비 표면 분석 XPS ToF-SIMS 스핀 코팅 낙하 주조 극저온
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