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Forberedelse av nanopartikler for ToF-SIMS og XPS-analyse
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Forberedelse av nanopartikler for ToF-SIMS og XPS-analyse

Article DOI: 10.3791/61758-v • 06:24 min • September 13th, 2020
September 13th, 2020 •
1, 1, 1, 2, 2, 2, 2, 2
1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

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En rekke forskjellige prosedyrer for å forberede nanopartikler for overflateanalyse presenteres (dråpestøping, spinnbelegg, avsetning fra pulver og kryofiksering). Vi diskuterer utfordringer, muligheter og mulige anvendelser av hver metode, spesielt når det gjelder endringene i overflateegenskapene forårsaket av de ulike forberedelsesmetodene.

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Kjemi Utgave 163 nanopartikler prøvepreparering overflateanalyse XPS ToF-SIMS spin-coating drop-casting kryofixation
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