Tof-sims
Tof-sims - Related Videos
09:48
In Situ Characterization of Hydrated Proteins in Water by SALVI and ToF-SIMS
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Cited by 13 •
2016
This work presents a protocol for liquid handling and sample introduction to a microchannel for in situ time-of-flight secondary ion mass spectrometry analysis of protein biomolecules in an aqueous solution.
06:24
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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Cited by 14 •
2020
A number of different procedures for preparing nanoparticles for surface analysis are presented (drop casting, spin coating, deposition from powders, and cryofixation). We discuss the challenges, opportunities, and possible applications of each method, particularly regarding the changes in the surface properties caused by the different preparation methods.
09:56
In Situ Characterization of Shewanella oneidensis MR1 Biofilms by SALVI and ToF-SIMS
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Cited by 8 •
2017
This article presents a method for growing a biofilm for in situ time-of-flight secondary ion mass spectrometry for chemical mapping in its hydrated state, enabled by a microfluidic reactor, System for Analysis at the liquid Vacuum Interface. The Shewanella oneidensis MR-1 with green fluorescence protein was used as a model.
10:22
In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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Cited by 4 •
2014
Soft landing of mass-selected ions onto surfaces is a powerful approach for the highly-controlled preparation of novel materials. Coupled with analysis by in situ secondary ion mass spectrometry (SIMS) and infrared reflection absorption spectroscopy (IRRAS), soft landing provides unprecedented insights into the interactions of well-defined species with surfaces.
07:27
MALDI-TOF Mass Spectrometry
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2023
Matrix-assisted laser desorption ionization (MALDI) is a mass spectrometry ion source ideal for the analysis of biomolecules. Instead of ionizing compounds in the gaseous state, samples are embedded in a matrix, which is struck by a laser. The matrix absorbs the majority of the energy; some of this energy is then transferred to the sample, which ionizes as a result. Sample ions can then be identified using a time-of-flight analyzer (TOF). This video covers principles of MALDI-TOF, including...
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After secondary ions leave the sample, the instrument separates them by their flight times. Because flight time depends on each ion’s mass-to-charge ratio, the resulting measurements distinguish different elemental and molecular species. This relationship allows chemists to interpret surface signals as chemical-composition information rather than simply as physical features.
A focused beam restricts sputtering to a small location on the sample, preserving spatial information about where secondary ions originate. By recording the chemical signals across different positions, ToF-SIMS can produce maps of elemental and molecular distributions. This capability is especially useful when composition varies across interfaces, coatings, polymers, or nanoscale regions.
Depth profiling uses repeated sputtering to remove material in successive layers. Secondary-ion measurements collected during this sequence can then be related to changing depth, revealing how elemental or molecular composition varies below the original surface. In chemistry, this approach helps examine layered materials and thin films rather than limiting analysis to the outermost exposed region.
ToF-SIMS can detect both elemental species and molecular species, allowing analysis of chemically diverse surfaces. This combination is valuable when a sample contains inorganic components alongside organic compounds, such as in coatings, polymers, or biological materials. The resulting signals help researchers examine chemical distributions and identify composition changes at material interfaces.
A typical workflow directs a focused primary ion beam onto the sample, collects the secondary ions released from the impacted region, and separates those ions according to flight time. Researchers then interpret the mass-related signals spatially or across successive sputtering steps. The chosen measurement perspective determines whether the result emphasizes surface composition, chemical imaging, or depth variation.
Researchers choose ToF-SIMS when they need chemically specific information from the outermost layers, interfaces, or thin films. Its high spatial sensitivity can reveal where elemental and molecular species are located, while sequential sputtering can show how those species change with depth. These capabilities support investigations of coatings, layered structures, and nanoscale chemical distributions.
In contamination analysis, ToF-SIMS can identify elemental or molecular species present at a material surface and help locate their distribution. In broader materials research, the technique supports studies of polymers, coatings, biological materials, and interfaces. Chemical maps and depth profiles provide complementary evidence about where unexpected or intentionally introduced species occur within a sample.