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JoVE Journal
Chemistry

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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
 

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

Article DOI: 10.3791/61758-v
September 13th, 2020

Chapters

Summary September 13th, 2020

A number of different procedures for preparing nanoparticles for surface analysis are presented (drop casting, spin coating, deposition from powders, and cryofixation). We discuss the challenges, opportunities, and possible applications of each method, particularly regarding the changes in the surface properties caused by the different preparation methods.

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