Semiconductor Doping

Semiconductor doping is the controlled addition of impurity atoms to a semiconductor to modify its electrical conductivity, making it fundamental to electronic engineering. Dopant atoms replace semiconductor atoms within the crystal lattice and create either extra electrons, producing n-type material, or holes, producing p-type material; dopant concentration determines carrier density and electrical behavior. Fabrication methods such as diffusion and ion implantation introduce dopants into selected regions, often followed by thermal treatment to activate them and repair lattice damage. Doping enables p-n junctions, diodes, transistors, and integrated circuits, while precise spatial and concentration control supports smaller, faster, and more energy-efficient electronic devices.

Semiconductor Doping - Related Videos

Education

JoVE Science Education - Physics

Semiconductors

0 Views •

2023

Source: Derek Wilson, Asantha Cooray, PhD, Department of Physics & Astronomy, School of Physical Sciences, University of California, Irvine, CA Semiconductors are materials whose ability to conduct an electrical current depends strongly on their temperature and level of impurity. The most common type of semiconductor material is crystalline silicon. Most pure semiconductors are not outstanding conductors; to improve conductivity, a pure semiconductor is often combined or "doped" with an...

Semiconductors

0 Views •

2024

There is variation in the electrical conductivity of materials - metals, semiconductors, and insulators that are showcased with the help of the energy band diagrams. Metals such as copper (Cu), zinc (Zn), or lead (Pb) have low resistivity and feature conduction bands that are either not fully occupied or overlap with the valence band, making a bandgap non-existent. This allows electrons in the highest energy levels of the valence band to easily transition to the conduction band upon gaining...

Research

JoVE Journal - Engineering

Monolayer Contact Doping of Silicon Surfaces and Nanowires Using Organophosphorus Compounds

0 Views •

Cited by 9 •

2013

A detailed procedure for surface doping of Silicon interfaces is provided. The ultra-shallow surface doping is demonstrated by using phosphorus containing monolayers and rapid annealing process. The method can be used for doping of macroscopic area surfaces as well as nanostructures.

Research

JoVE Journal - Engineering
Free Sample

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

0 Views •

Cited by 4 •

2016

The optical, electrical, and structural properties of dislocations and of grain boundaries in semiconductor materials can be determined by experiments performed in a scanning electron microscope. Electron microscopy has been used to investigate cathodoluminescence, electron beam induced current, and diffraction of backscattered electrons.

Research

JoVE Journal - Engineering
Free Sample

Monovalent Cation Doping of CH3NH3PbI3 for Efficient Perovskite Solar Cells

0 Views •

Cited by 31 •

2017

Here, we present a protocol to adjust the properties of solution-processed CH3NH3PbI3 through the incorporation of monovalent cation additives in order to achieve highly efficient perovskite solar cells.

View All Results

FAQs

Related Topics