Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films

Spencer Novak; Pao-Tai Lin; Cheng Li; Nikolay Borodinov; Zhaohong Han; Corentin Monmeyran; Neil Patel; Qingyang Du; Marcin Malinowski; Sasan Fathpour; Chatdanai Lumdee; Chi Xu; Pieter G. Kik; Weiwei Deng; Juejun Hu; Anuradha Agarwal; Igor Luzinov; Kathleen Richardson

doi:10.3791/54379

Journal

/

工程学

/

厚度均匀葛电沉积 23锑 7取值 70和As 40取值 60硫系玻璃薄膜

Electrospray Deposition of Uniform Thickness Ge<sub>23</sub>Sb<sub>7</sub>S<sub>70</sub> and As<sub>40</sub>S<sub>60</sub> Chalcogenide Glass Films

JoVE 杂志
工程学

需要订阅 JoVE 才能查看此. 登录或开始免费试用。

JoVE 杂志工程学

Electrospray Deposition of Uniform Thickness Ge₂₃Sb₇S₇₀ and As₄₀S₆₀ Chalcogenide Glass Films

厚度均匀葛电沉积 23锑 7取值 70和As 40取值 60硫系玻璃薄膜

Please note that all translations are automatically generated. Click here for the English version.

8,437 Views

•

08:38 min

•

August 19, 2016

DOI:

10.3791/54379-v

DOI:

10.3791/54379-v

•

08:38 min

August 19, 2016

•

6 Views

Spencer Novak¹, Pao-Tai Lin^2,3, Cheng Li⁴, Nikolay Borodinov¹, Zhaohong Han⁵, Corentin Monmeyran⁵, Neil Patel⁵, Qingyang Du⁵, Marcin Malinowski⁴, Sasan Fathpour⁴, Chatdanai Lumdee⁴, Chi Xu⁴, Pieter G. Kik⁴, Weiwei Deng⁶, Juejun Hu⁷, Anuradha Agarwal⁷, Igor Luzinov¹, Kathleen Richardson⁴

¹Department of Materials Science and Engineering,Clemson University, ²Department of Materials Science and Engineering,Texas A&M University, ³Department of Electrical and Computer Engineering,Texas A&M University, ⁴College of Optics and Photonics, Center for Research and Education in Optics and Lasers (CREOL),University of Central Florida, ⁵Department of Materials Science and Engineering,Massachusetts Institute of Technology, ⁶Department of Mechanical Engineering,Virginia Polytechnic Institute, ⁷Microphotonics Center,Massachusetts Institute of Technology

成績單

Summary

A method of uniform thickness solution-derived chalcogenide glass film deposition is demonstrated using computer numerical controlled motion of a single-nozzle electrospray.

Explore More Videos

Electrospray Deposition Chalcogenide Glass Films Mid-infrared Photonic Applications Film Thickness Profile Compositional Gradient Chip-based Mid-infrared Chemical Sensing Taylor Cone Serpentine Path Linear Thickness Profile Annealing FTIR Spectrum

厚度均匀葛电沉积<sub> 23</sub>锑<sub> 7</sub>取值<sub> 70</sub>和As<sub> 40</sub>取值<sub> 60</sub>硫系玻璃薄膜

成績單

Automatically generated

Summary

Automatically generated

Explore More Videos

Related Videos