Electron Transparent Lamellae
Electron Transparent Lamellae - Related Videos
07:00
Preparing Lamellae from Vitreous Biological Samples Using a Dual-Beam Scanning Electron Microscope for Cryo-Electron Tomography
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Cited by 8 •
2021
Using focused ion beam milling to produce vitreous on-grid lamellae from plunge frozen biological samples for cryo-electron tomography.
10:54
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
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Cited by 5 •
2014
Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.
10:27
Fabrication of Nano-engineered Transparent Conducting Oxides by Pulsed Laser Deposition
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Cited by 15 •
2013
We describe the experimental method to deposit nanostructured oxide thin films by nanosecond Pulsed Laser Deposition (PLD) in the presence of a background gas. By using this method Al-doped ZnO (AZO) films, from compact to hierarchically structured as nano-tree forests, can be deposited.
08:29
Workflow Using a Cryogenic Coincident Fluorescence, Electron, and Ion Beam Microscope for Targeted Milling of Cells
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Cited by 2 •
2025
This workflow enables lamella production targeting fluorescently labeled biological structures that are small (<1 μm in axial extent) and rare (1 copy per cell) using a cryogenic tri-coincident imaging platform. This platform integrates fluorescence microscopy, focused ion beam milling, and scanning electron microscopy at a single focal position and enables simultaneous fluorescence microscopy while milling.
05:08
The Mammalian Ocular Lens in Focus: Development, Anatomy, Physiology, Transparency, Biomechanics, and Age-Related Challenges
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2026
The function of the ocular lens to focus light onto the retina depends on tissue transparency, biomechanics, and refractive index. This review highlights the three-dimensional architecture of the lens and discusses the complex mechanisms that maintain tissue homeostasis.
FAQs
Reducing the lamella thickness lowers the amount of material electrons must traverse, which limits electron scattering and allows the TEM to produce interpretable nanoscale information. If the section remains too thick, structural and compositional features may be obscured. Controlled thinning therefore determines whether defects, phases, and interfaces can be distinguished in the final analysis.
Focused ion beam milling removes material around a chosen region rather than preparing an arbitrary section from the entire component. Progressive removal exposes and thins the selected location until it is suitable for electron transmission. This site-specific control is especially important when the feature of interest lies within a complex engineering device or localized failure region.
TEM examination of the prepared section can reveal crystallographic defects, phase distributions, interfaces, and damage at nanoscale dimensions. These features may be inaccessible or unresolved in conventional imaging because they require electrons to pass through a suitably thin, targeted region. The resulting observations help distinguish local structural changes within otherwise complex materials or components.
A lamella allows researchers to examine the internal structure of a precisely selected location and compare that structure with the component’s observed behavior. Defects, phases, interfaces, or damage identified in the section can provide nanoscale context for macroscopic performance. This connection supports engineering decisions involving material development, process optimization, and investigation of component failures.
Preparation begins by selecting the region that requires nanoscale examination. Focused ion beam milling then removes surrounding material, followed by progressive thinning of the exposed section. The process continues until electron scattering is sufficiently reduced for TEM examination. This sequence preserves the connection between the selected location and the engineering problem being investigated.
The preparation workflow relies on focused ion beam equipment to remove surrounding material and control thinning at a selected site. Transmission electron microscopy then examines the resulting section using transmitted electrons. Together, the instruments provide both spatially targeted specimen preparation and nanoscale analysis of structure, composition, defects, phases, interfaces, and damage.
They are useful when an engineering question depends on localized nanoscale structure within a complex component. Applications identified for this approach include failure analysis, materials development, semiconductor research, and process optimization. By exposing features such as defects, phase distributions, interfaces, or damage, the analysis can help relate manufacturing conditions or service-related changes to component performance.