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Biology

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Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
 

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

Article DOI: 10.3791/62886-v 08:20 min October 25th, 2021
October 25th, 2021

Kapitel

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