Masashi Kato Department of Electrical and Mechanical Engineering, Frontier Research Institute for Materials Science Nagoya Institute of Technology Biography Publications Institution JoVE Articles Masashi Kato Masashi Kato is an Associate Professor in Department of Electrical and Mechanical Engineering and Frontier Research Institute for Materials Science, Nagoya Institute of Technology (NITech), Japan. He received his undergraduate from NITech in 1998, and also a Ph.D. from NITech in 2003.His research interests are semiconductor material characterization and semiconductor application. He has developed novel characterization systems for carrier recombination lifetime in wide band gap semiconductors, and based on such the characterization techniques, he has identified carrier recombination mechanisms in several semiconductor materials.He has received the Award for Encouragement of Research in IUMRS-ICA2014 from The Materials Research Society of Japan (2014) and Prizes for Science and Technology (Public Understanding Promotion Category) from The Commendation for Science and Technology by the Minister of Education, Culture, Sports, Science and Technology (2014). Publications Increased Expression Level of Hsp70 in the Inner Ears of Mice by Exposure to Low Frequency Noise Hearing Research. 06, 2018 | Pubmed ID: 29519617 Solar Water Splitting Utilizing a SiC Photocathode, a BiVO Photoanode, and a Perovskite Solar Cell ChemSusChem. 11, 2017 | Pubmed ID: 28960942 Risk Assessment of Neonatal Exposure to Low Frequency Noise Based on Balance in Mice Frontiers in Behavioral Neuroscience. 2017 | Pubmed ID: 28275341 Misure di vita portante in semiconduttori attraverso il metodo di deperimento di fotoconduttività a microonde Takato Asada1, Yoshihito Ichikawa1, Masashi Kato1,2 1Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology, 2Frontier Research Institute for Material Science, Nagoya Institute of Technology JoVE 59007 Ingegneria
Misure di vita portante in semiconduttori attraverso il metodo di deperimento di fotoconduttività a microonde Takato Asada1, Yoshihito Ichikawa1, Masashi Kato1,2 1Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology, 2Frontier Research Institute for Material Science, Nagoya Institute of Technology JoVE 59007 Ingegneria