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シンクロトロンベースのハードX線マイクロトモグラフィーを用いて電池の故障解析
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Article
DOI:
10.3791/53021-v
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08:12 min
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August 26th, 2015
シンクロトロンベースのハードX線マイクロトモグラフィーを用いて電池の故障解析
August 26th, 2015
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1Department of Materials Science and Engineering, University of California Berkeley, 2Materials Science Division, Lawrence Berkeley National Laboratory, 3Advanced Light Source Division, Lawrence Berkeley National Laboratory, 4Department of Chemical and Biomolecular Engineering, University of California Berkeley, 5Environmental Energy Technology Division, Lawrence Berkeley National Laboratory