Synchrotron X-ray Microtomography

Synchrotron X-ray microtomography is a nondestructive imaging technique that reconstructs three-dimensional internal structure from many X-ray projections, enabling biological specimens to be examined without sectioning. At a synchrotron, intense, highly collimated X-ray beams pass through a sample as it rotates; differences in attenuation, and in some setups phase shifts, are computationally reconstructed into volumetric images with micrometer-scale detail. The method can reveal tissue architecture, vascular networks, mineralized structures, and other features that are difficult to observe with conventional microscopy. It supports quantitative studies of morphology, development, biomechanics, and disease while preserving complex specimens for further analysis.

Synchrotron X-ray Microtomography - Related Videos

Research

JoVE Journal - Engineering

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

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Cited by 7 •

2015

Synchrotron-based hard X-ray microtomography is used to image the electrochemical growth of dendrites from a lithium metal electrode through a solid polymer electrolyte membrane.

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

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Cited by 5 •

2016

For this study synchrotron radiation micro-tomography, a non-destructive three-dimensional imaging technique, is employed to investigate an entire microelectronic package with a cross-sectional area of 16 x 16 mm. Due to the synchrotron's high flux and brightness the sample was imaged in just 3 min with an 8.7 µm spatial resolution.

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

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Cited by 9 •

2008

We used synchrotron X-ray tomography at the European Synchrotron Radiation Facility (ESRF) to non-invasively produce 3D tomographic datasets with a pixel-resolution of 0.7µm. Using volume rendering software, this allows the reconstruction of internal structures in their natural state without the artefacts produced by histological sectioning.

Preparing Adherent Cells for X-ray Fluorescence Imaging by Chemical Fixation

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Cited by 14 •

2015

Here, we present a protocol on how to determine the quantity and distribution of metals in a sample using synchrotron X-ray fluorescence. We focus on adherent cells, and describe the chemical fixation method to prepare this sample. We then describe how to mount and image the sample using synchrotron X-rays.

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Cited by 10 •

2016

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.

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