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Engineering

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Engineering

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Materials Engineering

Focused Ion Beams

Description

Source: Sina Shahbazmohamadi and Peiman Shahbeigi-Roodposhti-Roodposhti, School of Engineering, University of Connecticut, Storrs, CT

As electron microscopes become more complex and widely used in research labs, it becomes more ...

Transcript

The Focused Ion Beam is an instrument that can be used to fabricate, trim, analyze, and characterize materials on micro and nano scales. Focused Ion Beams are used in a wide variety of fields, ranging from electronics to medicine.

Focused Ion Beam Systems accelerate Liquid metal ions in a vacuum to form a beam. Using a series of Electromag...

Tags

Focused Ion BeamIon MillingSecondary Electron ImagingChemical Vapor DepositionScanning Electron MicroscopeCoincident Eucentric PointNanofabricationTomographic ImagingIon ImplantationSputter Coating