Name: atomic force microscopy for surface mapping
Uploaded: 2023-04-30T12:00:37.000Z
Duration: 1 min 8 s
Channel: JoVE

Atomic force microscopy or AFM generates an image using a nanoprobe to provide topographical information about a sample with nanometer resolution.
While an optical microscope can magnify up to 1000X, the magnification potential of AFM is up to 1,000,000X.
AFM can create images of both fixed and live specimens, allowing it to capture dynamic cellular processes such as actin dynamics.
The AFM nanoprobe is attached to the end of a flexible cantilever, and together they scan the sample. The probe follows the contours of the sample surface, moving up and down, which displaces the cantilever.
In one type of AFM, a laser beam is aimed at the cantilever, and as it moves, the reflection of the laser also moves.
A position-sensitive photodetector records the deflection of the laser beam.
The data is sent to a computer where software can process it to generate a three-dimensional image of the sample surface.

atomic force microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the cantilever and tip assembly. Probes are the most commonly replaced part on this type of microscope because&#160; the constant interaction with the samples wears down the tip. Therefore, the choice of material for the probe depends on the properties of the sample. Silicon probes, used to analyze hard samples, are stiffer and sharper than silicon nitride probes, which are better suited to scan softer samples. These sharp tips are produced using electrochemical etching or carbon nanotubes for higher accuracy analysis.
Imaging Modes of AFM
In AFM, surface topography is studied using the interaction between the probe tip and the sample surface. There are two main imaging modes &#8212; a static mode, also referred to as the contact mode, and a dynamic mode.
In the static or contact mode, the tip of the probe is in continuous contact with the sample surface. As the tip drags over the surface, repulsive forces between the sample and the tip result in the cantilever bending, which is recorded. The entire specimen surface is scanned back and forth in both x- and y-axes, called raster scanning, while the vertical movement of the cantilever records the z-axis, thus generating a 3D image.
In the dynamic mode, the probe oscillates just above the sample surface, coming close to, but not touching the surface. Attractive and repulsive forces determine the variation in distance between the tip and the sample, affecting the amplitude of cantilever oscillation. This feedback is recorded to construct the surface topography of the sample.

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, ...

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KEY TERMS AND CONCEPTS

atomic force microscopy for surface mapping

Atomic force microscopy is used to map the surface details of materials. It can examine ceramics, glass, polymers, and biological samples. The method gives far more resolution than an optical imaging system and produces three-dimensional surface profiles instead of flat 2D images.

The probe is the key part of an AFM setup. It includes the cantilever and tip assembly, and it is also the part that is replaced most often. Constant contact with samples wears down the tip, so probe choice depends on the sample being scanned. Silicon probes are stiffer and sharper, which makes them useful for hard samples. Silicon nitride probes are better for softer samples.

AFM tips can be made with electrochemical etching or with carbon nanotubes to improve accuracy. The microscope reads surface topography by tracking how the probe tip interacts with the sample surface. This interaction is recorded as the probe scans across the surface.

AFM uses two main imaging modes. In static mode, also called contact mode, the tip stays in continuous contact with the surface. As it drags across the sample, repulsive forces bend the cantilever, and that bending is recorded. The sample is scanned back and forth in the x- and y-axes, which is called raster scanning, while the vertical motion of the cantilever records the z-axis and builds a 3D image.

In dynamic mode, the probe oscillates just above the sample surface. It comes close to the surface without touching it. Attractive and repulsive forces change the distance between the tip and the sample and affect the oscillation amplitude. That feedback is then used to construct the surface topography.

Atomic Force Microscopy for Surface Mapping

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Atomic force microscopy is used to map the surface details of materials. It can examine ceramics, glass, polymers, and biological samples. The method gives far more resolution than an optical imaging system and produces three-dimensional surface profiles instead of flat 2D images. The probe is the key part of an AFM setup. It includes the cantilever and tip assembly, and it is also the part that is replaced most often. Constant contact with samples wears down the tip, so probe choice depends...

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key terms and concepts

Learn how atomic force microscopy maps surfaces, why probe choice matters, and how contact and dynamic modes build detailed 3D images of samples.

Atomic Force Microscopy for Surface Mapping | JoVE K12

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JoVE Core Cell Biology illustrates complex cellular processes in easy-to-understand yet comprehensive animated video lessons. This collection focuses on the essential components and functions of cells, including organelles and membranes, cellular transport, and cell energetics. It is complemented by scientist-in-action videos that demonstrate the application of cell biology in real-world research experiments.

Atomic Force Microscopy for Surface Mapping

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