Backscattered Electron Analysis

Backscattered electron analysis is a scanning electron microscopy technique that uses elastically scattered electrons to reveal compositional and structural differences in a specimen. When the electron beam interacts with a sample, elements with higher atomic numbers backscatter more electrons and appear brighter, while surface topography and detector geometry also influence image contrast. In biology, this approach helps distinguish mineralized from nonmineralized tissue, identify embedded particles or metals, and examine cell, tissue, and biomaterial interfaces. Combined with complementary microanalytical methods, backscattered electron imaging supports studies of biomineralization, bone structure, pathology, and the distribution of inorganic components in biological specimens.

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Research

JoVE Journal - Neuroscience

Analysis of Brain Mitochondria Using Serial Block-Face Scanning Electron Microscopy

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Cited by 32 •

2016

Mitochondrial visualization and analysis from mammalian brain tissue is a challenging task. Here, we describe how three dimensional (3D) reconstruction analysis from the serial block-face scanning electron microscopy (SBFSEM) can be used to gain insights on the morphological and volumetric analysis of this critical energy generating organelle.

Electron Microscopic Analysis of Myelin Damage in a Rat Model of Optic Nerve Injury

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2025

The control section exhibits axons with tightly packed myelin sheaths containing concentric plasma membrane layers. The injured section exhibits decompacted myelin with large gaps.

Research

JoVE Journal - Biology
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Fruit Volatile Analysis Using an Electronic Nose

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Cited by 10 •

2012

A rapid method for volatile compound analysis in fruit is described. The volatile compounds present in the headspace of a homogenate of the sample are rapidly separated and detected with ultra-fast gas chromatography (GC) coupled with a surface acoustic wave (SAW) sensor. A procedure for data handling and analysis is also discussed.

Education

JoVE Science Education - Chemistry

Scanning Electron Microscopy (SEM)

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2023

Source: Laboratory of Dr. Andrew J. Steckl — University of Cincinnati A scanning electron microscope, or SEM, is a powerful microscope that uses electrons to form an image. It allows for imaging of conductive samples at magnifications that cannot be achieved using traditional microscopes. Modern light microscopes can achieve a magnification of ~1,000X, while typical SEM can reach magnifications of more than 30,000X. Because the SEM doesn’t use light to create images, the resulting pictures it...

Research

JoVE Journal - Engineering
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

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Cited by 4 •

2016

The optical, electrical, and structural properties of dislocations and of grain boundaries in semiconductor materials can be determined by experiments performed in a scanning electron microscope. Electron microscopy has been used to investigate cathodoluminescence, electron beam induced current, and diffraction of backscattered electrons.

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