Backscattered Electron Detection

Backscattered electron detection is a scanning electron microscopy (SEM) method that forms images from electrons re-emitted after interacting with a specimen, providing compositional and structural information at the surface. When the focused electron beam strikes a sample, some electrons undergo elastic scattering and return toward a detector; regions containing elements with higher atomic numbers generally produce stronger signals and appear brighter. In neuroscience, this contrast can help distinguish mineralized deposits, metal-containing labels, and cellular or tissue interfaces in fixed specimens, complementing secondary-electron topography. The method supports ultrastructural analysis and links microscopic composition with neural anatomy and pathology.

Backscattered Electron Detection - Related Videos

Research

JoVE Journal - Bioengineering

Microfluidic Platform with Multiplexed Electronic Detection for Spatial Tracking of Particles

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Cited by 8 •

2017

We demonstrate a microfluidic platform with an integrated surface electrode network that combines resistive pulse sensing (RPS) with code division multiple access (CDMA), to multiplex detection and sizing of particles in multiple microfluidic channels.

Education

JoVE Science Education - Chemistry

Scanning Electron Microscopy (SEM)

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2023

Source: Laboratory of Dr. Andrew J. Steckl — University of Cincinnati A scanning electron microscope, or SEM, is a powerful microscope that uses electrons to form an image. It allows for imaging of conductive samples at magnifications that cannot be achieved using traditional microscopes. Modern light microscopes can achieve a magnification of ~1,000X, while typical SEM can reach magnifications of more than 30,000X. Because the SEM doesn’t use light to create images, the resulting pictures it...

Electron Microscopic Analysis of Myelin Damage in a Rat Model of Optic Nerve Injury

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2025

The control section exhibits axons with tightly packed myelin sheaths containing concentric plasma membrane layers. The injured section exhibits decompacted myelin with large gaps.

Research

JoVE Journal - Engineering
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

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Cited by 4 •

2016

The optical, electrical, and structural properties of dislocations and of grain boundaries in semiconductor materials can be determined by experiments performed in a scanning electron microscope. Electron microscopy has been used to investigate cathodoluminescence, electron beam induced current, and diffraction of backscattered electrons.

Focused Ion Beam Scanning Electron Microscopy for 3D Reconstruction of Synaptically Linked Neurons

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2025

Take a fixed section of mouse cortical brain tissue exhibiting neuronal axons and dendrites. The dendrites possess protrusions, known as dendritic spines, which form synapses with axons.Incubate the tissue with osmium-ferrocyanide, which binds to lipids, followed by another osmium application, which enhances structural contrast for imaging.Stain with a heavy metal compound that binds to macromolecules and enhances contrast.Dehydrate using increasing alcohol concentrations for resin...

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